TY - GEN
T1 - Γ-radiation dosimetry using screen printed nickel oxide thick films
AU - Arshak, K.
AU - Korostynska, O.
AU - Harris, J.
PY - 2002
Y1 - 2002
N2 - Thick films of Nickel oxide (NiO) were investigated for γ-radiation dosimetry purposes. Samples were fabricated using the thick film screen printing technique. Absorption spectra for NiO films were recorded and the values of the optical band gap for as-printed, irradiated and annealed films were calculated. It was found that the optical band gap value decreased as the radiation dose was increased. Samples with an Ag-NiO-Ag sandwich structure were exposed to a 60Co γ-radiation source at a dose rate of 6 Gy/min. The relative change in current increased linearly with increased dosage up to 720 Gy. The I-V characteristics indicated a Poole-Frenkel conduction mechanism. It was found that annealing restored both the electrical and the optical properties of the samples.
AB - Thick films of Nickel oxide (NiO) were investigated for γ-radiation dosimetry purposes. Samples were fabricated using the thick film screen printing technique. Absorption spectra for NiO films were recorded and the values of the optical band gap for as-printed, irradiated and annealed films were calculated. It was found that the optical band gap value decreased as the radiation dose was increased. Samples with an Ag-NiO-Ag sandwich structure were exposed to a 60Co γ-radiation source at a dose rate of 6 Gy/min. The relative change in current increased linearly with increased dosage up to 720 Gy. The I-V characteristics indicated a Poole-Frenkel conduction mechanism. It was found that annealing restored both the electrical and the optical properties of the samples.
UR - https://www.scopus.com/pages/publications/84906702532
U2 - 10.1109/MIEL.2002.1003210
DO - 10.1109/MIEL.2002.1003210
M3 - Conference contribution
AN - SCOPUS:84906702532
SN - 0780372352
SN - 9780780372351
T3 - 2002 23rd International Conference on Microelectronics, MIEL 2002 - Proceedings
SP - 357
EP - 360
BT - 2002 23rd International Conference on Microelectronics, MIEL 2002 - Proceedings
PB - IEEE Computer Society
T2 - 2002 23rd International Conference on Microelectronics, MIEL 2002
Y2 - 12 May 2002 through 15 May 2002
ER -