TY - GEN
T1 - A destructive evolutionary algorithm process
AU - Sullivan, Joe
AU - Ryan, Conor
PY - 2007
Y1 - 2007
N2 - This paper describes the application of evolutionary search to the problem of Flash memory wear-out. The current method for establishing memory operating parameters is a time consuming and expensive manual process of destructive testing. Understandably this process is normally undertaken only at design time. The results are sub optimum solutions which do not minimise ware-out over the lifetime of the device. We establish the viability of a hardware platform that utilises an EA (Evolutionary Algorithm) to discover optimal operating parameter settings automatically. Here we describe this hardware and reveal results demonstrating an average life extension of between 250% and 350% over the factory set conditions with a maximum life extension exhibited of 700% for cells within the same device. Furthermore since the process is automated it is possible to leverage the spread between process lots to further enhance device specifications, facilitating the near no cost life extension of a split-gate Flash memory device.
AB - This paper describes the application of evolutionary search to the problem of Flash memory wear-out. The current method for establishing memory operating parameters is a time consuming and expensive manual process of destructive testing. Understandably this process is normally undertaken only at design time. The results are sub optimum solutions which do not minimise ware-out over the lifetime of the device. We establish the viability of a hardware platform that utilises an EA (Evolutionary Algorithm) to discover optimal operating parameter settings automatically. Here we describe this hardware and reveal results demonstrating an average life extension of between 250% and 350% over the factory set conditions with a maximum life extension exhibited of 700% for cells within the same device. Furthermore since the process is automated it is possible to leverage the spread between process lots to further enhance device specifications, facilitating the near no cost life extension of a split-gate Flash memory device.
UR - http://www.scopus.com/inward/record.url?scp=49349106196&partnerID=8YFLogxK
U2 - 10.1109/FBIT.2007.99
DO - 10.1109/FBIT.2007.99
M3 - Conference contribution
AN - SCOPUS:49349106196
SN - 0769529992
SN - 9780769529998
T3 - Proceedings of the Frontiers in the Convergence of Bioscience and Information Technologies, FBIT 2007
SP - 761
EP - 764
BT - Proceedings of the Frontiers in the Convergence of Bioscience and Information Technologies, FBIT 2007
T2 - Frontiers in the Convergence of Bioscience and Information Technologies, FBIT 2007
Y2 - 11 October 2007 through 13 October 2007
ER -