Skip to main navigation Skip to search Skip to main content

A Lock-Free, Non-Blocking, In-Line Processing Architecture for High-Throughput and Regulatory-Compliant Blockchain Trading Applications

Research output: Contribution to conferencePaperpeer-review

Abstract

Regulated DeFi demands blockchain trading systems that satisfy both high-throughput performance and regulatory compliance. We present an empirical analysis of architectural patterns for high-throughput blockchain trading, based on a production system deployed for live trading operations. Using a two-layer hybrid model separating off-chain compliance from on-chain settlement, we conduct an ablation study of five architectural variants. Our symbol-sharded, lock-free architecture achieves 31.19 tx/sec—a 2.8x improvement over conventional designs and 125-fold gain from naive baselines.

Our analysis reveals migrating bottlenecks: resolving blockchain constraints exposes server-side crises. Ethereum's nonce mechanism limits naive parallelism to 36% throughput gain, while circumventing it with multiple wallets causes 9x latency increases due to lock contention. Our lock-free transaction submission model, inspired by HFT architectures, reduces latency by 44% while maintaining peak throughput, demonstrating that holistic co-design of on-chain and off-chain components is essential for optimal performance.
Original languageEnglish (Ireland)
Publication statusAccepted/In press - 11 Sept 2026
EventProceedings of the 20th European Conference on Software Architecture - Italy, Bolzano, Italy
Duration: 7 Sept 202611 Sept 2026
https://conf.researchr.org/home/ecsa-2026

Conference

ConferenceProceedings of the 20th European Conference on Software Architecture
Abbreviated titleECSA 2026
Country/TerritoryItaly
CityBolzano
Period7/09/2611/09/26
Internet address

Fingerprint

Dive into the research topics of 'A Lock-Free, Non-Blocking, In-Line Processing Architecture for High-Throughput and Regulatory-Compliant Blockchain Trading Applications'. Together they form a unique fingerprint.

Cite this