A new quality estimation methodology for mixed-signal and analogue ICs

T. Olbrich; I. A. Grout; Y. Eben Aimine; A. M. Richardson; J. Contensou

doi:10.1109/edtc.1997.582419

A new quality estimation methodology for mixed-signal and analogue ICs

T. Olbrich, I. A. Grout, Y. Eben Aimine, A. M. Richardson, J. Contensou

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

IC product quality is commonly described as the faulty device level at shipment and is becoming an increasingly important metric in the Microelectronics Industry. This paper presents and demonstrates a quality estimation approach based on Inductive Fault Analysis for mixed- signal and analogue ICs, that quantitatively models the quality related parameters prior to production. It is shown how the approach can be used to optimise the manufacturing test program.

Original language	English
Title of host publication	Proceedings of the 1997 European Conference on Design and Test, EDTC 1997
Publisher	Association for Computing Machinery, Inc
Pages	573-580
Number of pages	8
ISBN (Electronic)	0818677864, 9780818677861
DOIs	https://doi.org/10.1109/edtc.1997.582419
Publication status	Published - 17 Mar 1997
Externally published	Yes
Event	1997 European Conference on Design and Test, EDTC 1997 - Paris, France Duration: 17 Mar 1997 → 20 Mar 1997

Publication series

Name	Proceedings of the 1997 European Conference on Design and Test, EDTC 1997

Conference

Conference	1997 European Conference on Design and Test, EDTC 1997
Country/Territory	France
City	Paris
Period	17/03/97 → 20/03/97

Access to Document

10.1109/edtc.1997.582419

Cite this

Olbrich, T., Grout, I. A., Aimine, Y. E., Richardson, A. M., & Contensou, J. (1997). A new quality estimation methodology for mixed-signal and analogue ICs. In Proceedings of the 1997 European Conference on Design and Test, EDTC 1997 (pp. 573-580). (Proceedings of the 1997 European Conference on Design and Test, EDTC 1997). Association for Computing Machinery, Inc. https://doi.org/10.1109/edtc.1997.582419

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title = "A new quality estimation methodology for mixed-signal and analogue ICs",

abstract = "IC product quality is commonly described as the faulty device level at shipment and is becoming an increasingly important metric in the Microelectronics Industry. This paper presents and demonstrates a quality estimation approach based on Inductive Fault Analysis for mixed- signal and analogue ICs, that quantitatively models the quality related parameters prior to production. It is shown how the approach can be used to optimise the manufacturing test program.",

author = "T. Olbrich and Grout, {I. A.} and Aimine, {Y. Eben} and Richardson, {A. M.} and J. Contensou",

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year = "1997",

month = mar,

day = "17",

doi = "10.1109/edtc.1997.582419",

language = "English",

series = "Proceedings of the 1997 European Conference on Design and Test, EDTC 1997",

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Olbrich, T, Grout, IA, Aimine, YE, Richardson, AM & Contensou, J 1997, A new quality estimation methodology for mixed-signal and analogue ICs. in Proceedings of the 1997 European Conference on Design and Test, EDTC 1997. Proceedings of the 1997 European Conference on Design and Test, EDTC 1997, Association for Computing Machinery, Inc, pp. 573-580, 1997 European Conference on Design and Test, EDTC 1997, Paris, France, 17/03/97. https://doi.org/10.1109/edtc.1997.582419

A new quality estimation methodology for mixed-signal and analogue ICs. / Olbrich, T.; Grout, I. A.; Aimine, Y. Eben et al.
Proceedings of the 1997 European Conference on Design and Test, EDTC 1997. Association for Computing Machinery, Inc, 1997. p. 573-580 (Proceedings of the 1997 European Conference on Design and Test, EDTC 1997).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AB - IC product quality is commonly described as the faulty device level at shipment and is becoming an increasingly important metric in the Microelectronics Industry. This paper presents and demonstrates a quality estimation approach based on Inductive Fault Analysis for mixed- signal and analogue ICs, that quantitatively models the quality related parameters prior to production. It is shown how the approach can be used to optimise the manufacturing test program.

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Olbrich T, Grout IA, Aimine YE, Richardson AM, Contensou J. A new quality estimation methodology for mixed-signal and analogue ICs. In Proceedings of the 1997 European Conference on Design and Test, EDTC 1997. Association for Computing Machinery, Inc. 1997. p. 573-580. (Proceedings of the 1997 European Conference on Design and Test, EDTC 1997). doi: 10.1109/edtc.1997.582419

A new quality estimation methodology for mixed-signal and analogue ICs

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