TY - GEN
T1 - A study on the effect of test vector randomness on test length and its fault coverage
AU - Sahari, Muhammad Sadiq
AU - A'Ain, Abu Khari
AU - Grout, Ian
PY - 2012
Y1 - 2012
N2 - This paper presents a study on the impact of test sequence randomness and the fault coverage (FC) it could produce through the use of a modified structure of the conventional linear feedback shift register (LFSR). By using double input signals, the modified LFSR can control the number of test patterns generated and also prevents the sequences from being stuck in all zeroes state. Fault simulations on ISCAS'85 benchmark circuits show that a high FC for combinational logic circuits has been obtained. Another observation is that the modified structure could achieve high FC with a smaller test sequence compared to other reported test pattern generation (TPG) techniques.
AB - This paper presents a study on the impact of test sequence randomness and the fault coverage (FC) it could produce through the use of a modified structure of the conventional linear feedback shift register (LFSR). By using double input signals, the modified LFSR can control the number of test patterns generated and also prevents the sequences from being stuck in all zeroes state. Fault simulations on ISCAS'85 benchmark circuits show that a high FC for combinational logic circuits has been obtained. Another observation is that the modified structure could achieve high FC with a smaller test sequence compared to other reported test pattern generation (TPG) techniques.
UR - http://www.scopus.com/inward/record.url?scp=84874155950&partnerID=8YFLogxK
U2 - 10.1109/SMElec.2012.6417196
DO - 10.1109/SMElec.2012.6417196
M3 - Conference contribution
AN - SCOPUS:84874155950
SN - 9781467323963
T3 - 2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings
SP - 503
EP - 506
BT - 2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012 - Proceedings
T2 - 2012 10th IEEE International Conference on Semiconductor Electronics, ICSE 2012
Y2 - 19 September 2012 through 21 September 2012
ER -