A2DTest: A complete integrated solution for on-chip ADC self-test and analysis

Brendan Mullane; Vincent O'Brien; Ciaran MacNamee; Thomas Fleischmann

doi:10.1109/TEST.2009.5355722

A2DTest: A complete integrated solution for on-chip ADC self-test and analysis

Brendan Mullane, Vincent O'Brien, Ciaran MacNamee, Thomas Fleischmann

Department of Electronics & Computer Engineering

University of Limerick

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

An on-chip BIST solution performing accurate ADC measurements is presented. The platform enables linear and dynamic testing to occur in parallel, significantly lowering test time and cost. On-chip hardware resources are optimized for ADC test application.

Original language	English
Title of host publication	International Test Conference, ITC 2009 - Proceedings
DOIs	https://doi.org/10.1109/TEST.2009.5355722
Publication status	Published - 15 Dec 2009
Event	International Test Conference, ITC 2009 - Austin, TX, United States Duration: 1 Nov 2009 → 6 Nov 2009

Publication series

Name	Proceedings - International Test Conference
ISSN (Print)	1089-3539

Conference

Conference	International Test Conference, ITC 2009
Country/Territory	United States
City	Austin, TX
Period	1/11/09 → 6/11/09

Access to Document

10.1109/TEST.2009.5355722

Cite this

@inproceedings{377d80de5fe243f9aefa6179de052f54,

title = "A2DTest: A complete integrated solution for on-chip ADC self-test and analysis",

abstract = "An on-chip BIST solution performing accurate ADC measurements is presented. The platform enables linear and dynamic testing to occur in parallel, significantly lowering test time and cost. On-chip hardware resources are optimized for ADC test application.",

author = "Brendan Mullane and Vincent O'Brien and Ciaran MacNamee and Thomas Fleischmann",

year = "2009",

month = dec,

day = "15",

doi = "10.1109/TEST.2009.5355722",

language = "English",

isbn = "9781424448678",

series = "Proceedings - International Test Conference",

booktitle = "International Test Conference, ITC 2009 - Proceedings",

note = "International Test Conference, ITC 2009 ; Conference date: 01-11-2009 Through 06-11-2009",

}

Mullane, B, O'Brien, V, MacNamee, C & Fleischmann, T 2009, A2DTest: A complete integrated solution for on-chip ADC self-test and analysis. in International Test Conference, ITC 2009 - Proceedings., 5355722, Proceedings - International Test Conference, International Test Conference, ITC 2009, Austin, TX, United States, 1/11/09. https://doi.org/10.1109/TEST.2009.5355722

TY - GEN

T1 - A2DTest

T2 - International Test Conference, ITC 2009

AU - Mullane, Brendan

AU - O'Brien, Vincent

AU - MacNamee, Ciaran

AU - Fleischmann, Thomas

PY - 2009/12/15

Y1 - 2009/12/15

N2 - An on-chip BIST solution performing accurate ADC measurements is presented. The platform enables linear and dynamic testing to occur in parallel, significantly lowering test time and cost. On-chip hardware resources are optimized for ADC test application.

AB - An on-chip BIST solution performing accurate ADC measurements is presented. The platform enables linear and dynamic testing to occur in parallel, significantly lowering test time and cost. On-chip hardware resources are optimized for ADC test application.

UR - http://www.scopus.com/inward/record.url?scp=76549105561&partnerID=8YFLogxK

U2 - 10.1109/TEST.2009.5355722

DO - 10.1109/TEST.2009.5355722

M3 - Conference contribution

AN - SCOPUS:76549105561

SN - 9781424448678

T3 - Proceedings - International Test Conference

BT - International Test Conference, ITC 2009 - Proceedings

Y2 - 1 November 2009 through 6 November 2009

ER -

A2DTest: A complete integrated solution for on-chip ADC self-test and analysis

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