@inproceedings{e36ea907ce1441e2848b20b876e5f7f0,
title = "An SOC platform for ADC test and measurement",
abstract = "An Analog to Digital Converter Built-in-Self-Test design for System-on-Chip applications is presented. Linear and dynamic ADC test occur in parallel to reduce overall test time. A ramp generator is used for linear histogram measurements and a sine-wave signal is applied for dynamic tests. The design precisely measures Hits-per-Code enabling accurate linearity test and a low-area optimal CPU operates dynamic measurements. Results demonstrate efficient silicon area overheads and lower test time capability.",
keywords = "ADC testing, BIST, Component, DFT, Dynamic test, Linearity test, System-on-chip",
author = "Brendan Mullane and Vincent O'Brien and Ciaran MacNamee and Thomas Fleischmann",
year = "2009",
doi = "10.1109/DDECS.2009.5012087",
language = "English",
isbn = "9781424433391",
series = "Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009",
pages = "4--7",
booktitle = "Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009",
note = "2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009 ; Conference date: 15-04-2009 Through 17-04-2009",
}