TY - GEN
T1 - Analysis of multiple process flows in an asic fab with a detailed photolithography area model
AU - Kabak, Kamil Erkan
AU - Heavey, Cathal
AU - Corbett, Vincent
PY - 2008
Y1 - 2008
N2 - ASIC fabs are characterized by multiple process flows. This is mainly due to the highly diversified product portfolios within such fabs. In this study, we first examined the cycle time for individual process flows in a medium volume ASIC fab. We compared these process flows in terms of overall cycle time and using a cycle time index. Secondly, focusing on photolithography we developed a simulation model that employs cycle time data to analyze the impacts of process flow diversity. Thirdly, we used this model to examine the impact on cycle time of changing the volumes of wafer starts on different process flows. The detailed results of simulation experiments along with the concluding remarks are given at the end of the study.
AB - ASIC fabs are characterized by multiple process flows. This is mainly due to the highly diversified product portfolios within such fabs. In this study, we first examined the cycle time for individual process flows in a medium volume ASIC fab. We compared these process flows in terms of overall cycle time and using a cycle time index. Secondly, focusing on photolithography we developed a simulation model that employs cycle time data to analyze the impacts of process flow diversity. Thirdly, we used this model to examine the impact on cycle time of changing the volumes of wafer starts on different process flows. The detailed results of simulation experiments along with the concluding remarks are given at the end of the study.
UR - http://www.scopus.com/inward/record.url?scp=60749132195&partnerID=8YFLogxK
U2 - 10.1109/WSC.2008.4736318
DO - 10.1109/WSC.2008.4736318
M3 - Conference contribution
AN - SCOPUS:60749132195
SN - 9781424427086
T3 - Proceedings - Winter Simulation Conference
SP - 2185
EP - 2193
BT - Proceedings of the 2008 Winter Simulation Conference, WSC 2008
T2 - 2008 Winter Simulation Conference, WSC 2008
Y2 - 7 December 2008 through 10 December 2008
ER -