TY - GEN
T1 - Analyzing second-order effects between optimizations for system-level test-based model generation
AU - Margaria, Tiziana
AU - Raffelt, Harald
AU - Steffen, Bernhard
PY - 2005
Y1 - 2005
N2 - Test-based model generation by classical automata learning is very expensive. It requires an impractically large number of queries to the system, each of which must be implemented as a system-level test case. Key towards the tractability of observation based model generation are powerful optimizations exploiting different kinds of expert knowledge in order to drastically reduce the number of required queries, and thus the testing effort. In this paper, we present a thorough experimental analysis of the second-order effects between such optimizations in order to maximize their combined impact.
AB - Test-based model generation by classical automata learning is very expensive. It requires an impractically large number of queries to the system, each of which must be implemented as a system-level test case. Key towards the tractability of observation based model generation are powerful optimizations exploiting different kinds of expert knowledge in order to drastically reduce the number of required queries, and thus the testing effort. In this paper, we present a thorough experimental analysis of the second-order effects between such optimizations in order to maximize their combined impact.
UR - http://www.scopus.com/inward/record.url?scp=33847107531&partnerID=8YFLogxK
U2 - 10.1109/TEST.2005.1584006
DO - 10.1109/TEST.2005.1584006
M3 - Conference contribution
AN - SCOPUS:33847107531
SN - 0780390393
SN - 9780780390393
T3 - Proceedings - International Test Conference
SP - 461
EP - 467
BT - IEEE International Test Conference, Proceedings, ITC 2005
T2 - IEEE International Test Conference, ITC 2005
Y2 - 8 November 2005 through 10 November 2005
ER -