Atom-by-atom STEM investigation of defect engineering in graphene

Q. M. Ramasse; D. M. Kepapstoglou; F. S. Hage; T. Susi; J. Kotakoski; C. Mangler; P. Ayala; J. Meyer; J. A. Hinks; S. Donnelly; R. Zan; C. T. Pan; S. J. Haigh; U. Bangert

doi:10.1017/S1431927614010411

Atom-by-atom STEM investigation of defect engineering in graphene

Q. M. Ramasse, D. M. Kepapstoglou, F. S. Hage, T. Susi, J. Kotakoski, C. Mangler, P. Ayala, J. Meyer, J. A. Hinks, S. Donnelly, R. Zan, C. T. Pan, S. J. Haigh, U. Bangert

Retired Staff

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	1736-1737
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614010411
Publication status	Published - 1 Aug 2014
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: 3 Aug 2014 → 7 Aug 2014

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@article{c651ced293fa4f68b46362dff5992960,

title = "Atom-by-atom STEM investigation of defect engineering in graphene",

author = "Ramasse, {Q. M.} and Kepapstoglou, {D. M.} and Hage, {F. S.} and T. Susi and J. Kotakoski and C. Mangler and P. Ayala and J. Meyer and Hinks, {J. A.} and S. Donnelly and R. Zan and Pan, {C. T.} and Haigh, {S. J.} and U. Bangert",

year = "2014",

month = aug,

day = "1",

doi = "10.1017/S1431927614010411",

language = "English",

volume = "20",

pages = "1736--1737",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

number = "3",

note = "Microscopy and Microanalysis 2014, M and M 2014 ; Conference date: 03-08-2014 Through 07-08-2014",

}

TY - JOUR

T1 - Atom-by-atom STEM investigation of defect engineering in graphene

AU - Ramasse, Q. M.

AU - Kepapstoglou, D. M.

AU - Hage, F. S.

AU - Susi, T.

AU - Kotakoski, J.

AU - Mangler, C.

AU - Ayala, P.

AU - Meyer, J.

AU - Hinks, J. A.

AU - Donnelly, S.

AU - Zan, R.

AU - Pan, C. T.

AU - Haigh, S. J.

AU - Bangert, U.

PY - 2014/8/1

Y1 - 2014/8/1

UR - http://www.scopus.com/inward/record.url?scp=84927929832&partnerID=8YFLogxK

U2 - 10.1017/S1431927614010411

DO - 10.1017/S1431927614010411

M3 - Conference article

AN - SCOPUS:84927929832

SN - 1431-9276

VL - 20

SP - 1736

EP - 1737

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

T2 - Microscopy and Microanalysis 2014, M and M 2014

Y2 - 3 August 2014 through 7 August 2014

ER -

Atom-by-atom STEM investigation of defect engineering in graphene

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