Atom-by-atom STEM investigation of defect engineering in graphene

Q. M. Ramasse; D. M. Kepapstoglou; F. S. Hage; T. Susi; J. Kotakoski; C. Mangler; P. Ayala; J. Meyer; J. A. Hinks; S. Donnelly; R. Zan; C. T. Pan; S. J. Haigh; U. Bangert

doi:10.1017/S1431927614010411

Atom-by-atom STEM investigation of defect engineering in graphene

Q. M. Ramasse
, D. M. Kepapstoglou
, F. S. Hage
, T. Susi
, J. Kotakoski
, C. Mangler
, P. Ayala
, J. Meyer
, J. A. Hinks
, S. Donnelly
, R. Zan
, C. T. Pan
, S. J. Haigh
, U. Bangert

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	1736-1737
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614010411
Publication status	Published - 1 Aug 2014
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: 3 Aug 2014 → 7 Aug 2014

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@article{c651ced293fa4f68b46362dff5992960,

title = "Atom-by-atom STEM investigation of defect engineering in graphene",

author = "Ramasse, \{Q. M.\} and Kepapstoglou, \{D. M.\} and Hage, \{F. S.\} and T. Susi and J. Kotakoski and C. Mangler and P. Ayala and J. Meyer and Hinks, \{J. A.\} and S. Donnelly and R. Zan and Pan, \{C. T.\} and Haigh, \{S. J.\} and U. Bangert",

year = "2014",

month = aug,

day = "1",

doi = "10.1017/S1431927614010411",

language = "English",

volume = "20",

pages = "1736--1737",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

number = "3",

note = "Microscopy and Microanalysis 2014, M and M 2014 ; Conference date: 03-08-2014 Through 07-08-2014",

}

TY - JOUR

T1 - Atom-by-atom STEM investigation of defect engineering in graphene

AU - Ramasse, Q. M.

AU - Kepapstoglou, D. M.

AU - Hage, F. S.

AU - Susi, T.

AU - Kotakoski, J.

AU - Mangler, C.

AU - Ayala, P.

AU - Meyer, J.

AU - Hinks, J. A.

AU - Donnelly, S.

AU - Zan, R.

AU - Pan, C. T.

AU - Haigh, S. J.

AU - Bangert, U.

PY - 2014/8/1

Y1 - 2014/8/1

UR - https://www.scopus.com/pages/publications/84927929832

U2 - 10.1017/S1431927614010411

DO - 10.1017/S1431927614010411

M3 - Conference article

AN - SCOPUS:84927929832

SN - 1431-9276

VL - 20

SP - 1736

EP - 1737

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

T2 - Microscopy and Microanalysis 2014, M and M 2014

Y2 - 3 August 2014 through 7 August 2014

ER -

Atom-by-atom STEM investigation of defect engineering in graphene

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