TY - GEN
T1 - AVERT
T2 - 33rd Irish Signals and Systems Conference, ISSC 2022
AU - McEllin, Jack
AU - Conway, Richard
AU - Ryan, Conor
N1 - Publisher Copyright:
© 2022 IEEE.
PY - 2022
Y1 - 2022
N2 - With the ever-growing complexity of digital circuits, the appeal of using Machine Learning in digital circuit design has grown significantly. Over the last 25 years, Evolutionary Algorithms have been used to create digital circuits in a field known as Evolutionary Hardware (EH). Using Hardware Description Languages (HDLs) in EH is an attractive prospect as the evolved circuits would be easy to understand and simple to integrate with existing IP designs. However, one limitation of this method is that a testbench must be created by hand to check the Device Under Testing's (DUT) functionality, increasing the preparatory work required to evolve a new design. This paper presents AVERT, an Automatic Verilog Testbench Generation Tool for Grammatical Evolution. By specifying the connection ports of the DUT and the test vectors (test cases) in a standard test vector file, we describe a system that allows a testbench to be generated for sequential and combinational designs written in both structural and behavioural modelling styles. We take three problems from the literature and successfully evolve candidate solutions for each problem. Experimental results show a significant improvement in simulation performance by evaluating multiple DUTs per testbench compared to a single DUT per testbench.
AB - With the ever-growing complexity of digital circuits, the appeal of using Machine Learning in digital circuit design has grown significantly. Over the last 25 years, Evolutionary Algorithms have been used to create digital circuits in a field known as Evolutionary Hardware (EH). Using Hardware Description Languages (HDLs) in EH is an attractive prospect as the evolved circuits would be easy to understand and simple to integrate with existing IP designs. However, one limitation of this method is that a testbench must be created by hand to check the Device Under Testing's (DUT) functionality, increasing the preparatory work required to evolve a new design. This paper presents AVERT, an Automatic Verilog Testbench Generation Tool for Grammatical Evolution. By specifying the connection ports of the DUT and the test vectors (test cases) in a standard test vector file, we describe a system that allows a testbench to be generated for sequential and combinational designs written in both structural and behavioural modelling styles. We take three problems from the literature and successfully evolve candidate solutions for each problem. Experimental results show a significant improvement in simulation performance by evaluating multiple DUTs per testbench compared to a single DUT per testbench.
KW - Combinational Circuits
KW - Evolutionary Algorithm
KW - Evolutionary Hardware
KW - Grammatical Evolution
KW - Sequential Circuits
KW - Verilog Testbench Generation
UR - http://www.scopus.com/inward/record.url?scp=85135877480&partnerID=8YFLogxK
U2 - 10.1109/ISSC55427.2022.9826162
DO - 10.1109/ISSC55427.2022.9826162
M3 - Conference contribution
AN - SCOPUS:85135877480
T3 - 2022 33rd Irish Signals and Systems Conference, ISSC 2022
BT - 2022 33rd Irish Signals and Systems Conference, ISSC 2022
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 9 June 2022 through 10 June 2022
ER -