Chemical nature of the luminescent centre in fresh and aged porous silicon layers

S. Gardelis, U. Bangert, B. Hamilton, R. F. Pettifer, D. A. Hill, R. Keyse, D. Teehan

Research output: Contribution to journalArticlepeer-review

Abstract

In this study we have used high resolution parallel electron energy loss spectroscopy (PEELS) and X-ray excited optical luminescence (XEOL) to investigate the chemical nature of the luminescence centre in fresh and aged porous silicon. We find that regardless of the non-stoichiometric oxides which were observed by PEELS in our fresh porous silicon layers, Si-Si bonded material is involved in the luminescence process. However, in the case of aged porous silicon both Si-Si and Si-O bonded material are involved.

Original languageEnglish
Pages (from-to)408-412
Number of pages5
JournalApplied Surface Science
Volume102
DOIs
Publication statusPublished - Aug 1996
Externally publishedYes

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