Fingerprint
Dive into the research topics of 'Damage effects in silicon and MNOS structures caused by beams of ionized and neutral argon atoms with energies below 5 keV'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Damage effects in silicon and MNOS structures caused by beams of ionized and neutral argon atoms with energies below 5 keV
U. Bangert, C. Jeynes, P. Goodhew, IH Wilson
Research output: Contribution to journal › Article › peer-review