TY - GEN
T1 - Design of a slim-line integrated probe using optical fibre technology that is suitable for microwave environments and measures reflection spectroscopy and temperature
AU - O'Farrell, M.
AU - Sheridan, C.
AU - Lewis, E.
AU - Zhao, W. Z.
AU - Sun, T.
AU - Grattan, K. T.V.
AU - Kerry, J.
AU - Jackman, N.
PY - 2007
Y1 - 2007
N2 - The work presented describes the development of a novel integrated optical sensor system for the simultaneous and online measurement of colour and temperature of food as it cooks in a large-scale microwave and hybrid oven systems. The integrated probe contains two different sensor concepts, one to monitor temperature, based on Fibre Bragg Grating (FBG) technology and a second for food quality, based on reflection spectroscopy in the visible wavelength range. The in-house designed probe was used to obtain measurements of product temperature in a conventional and microwave oven. The performance of the FBG temperature sensor within the combined optical probe was thus evaluated for use in conventional and microwave ovens.
AB - The work presented describes the development of a novel integrated optical sensor system for the simultaneous and online measurement of colour and temperature of food as it cooks in a large-scale microwave and hybrid oven systems. The integrated probe contains two different sensor concepts, one to monitor temperature, based on Fibre Bragg Grating (FBG) technology and a second for food quality, based on reflection spectroscopy in the visible wavelength range. The in-house designed probe was used to obtain measurements of product temperature in a conventional and microwave oven. The performance of the FBG temperature sensor within the combined optical probe was thus evaluated for use in conventional and microwave ovens.
UR - http://www.scopus.com/inward/record.url?scp=48349097645&partnerID=8YFLogxK
U2 - 10.1109/ICSENS.2007.4388483
DO - 10.1109/ICSENS.2007.4388483
M3 - Conference contribution
AN - SCOPUS:48349097645
SN - 1424412617
SN - 9781424412617
T3 - Proceedings of IEEE Sensors
SP - 652
EP - 655
BT - The 6th IEEE Conference on SENSORS, IEEE SENSORS 2007
T2 - 6th IEEE Conference on SENSORS, IEEE SENSORS 2007
Y2 - 28 October 2007 through 31 October 2007
ER -