TY - GEN
T1 - Developing a Test Strategy for Mathematics of Arrays Computation Cores
AU - Grout, Ian
AU - Mullin, Lenore
N1 - Publisher Copyright:
© 2025 IEEE.
PY - 2025
Y1 - 2025
N2 - Small size, hardware-only, custom data processing cores connected to a host processor are increasingly considered in digital systems design to provide the ability for accelerating data processing operations through hardware acceleration and parallel processing. These can be realized in different forms such as a custom core connected to a host processor on the same die as the processor, as a separate die (e.g., a chiplet) within the same package as the processor or as a separate Integrated Circuit. These require advanced design flows, low-geometry fabrication processes, and suitable test circuit insertion to implement a suitable test strategy. In this paper, the testability of custom hardware cores is considered through test circuit insertion based on the IJTAG standard. The core is to perform data processing operations based on the Mathematics of Arrays and serial communications is based on the Serial Peripheral Interface. This interface is used for both normal operating mode and the IJTAG based test mode. The system design is considered at the pre-synthesis design development stage and identifies architectural considerations for such system designs.
AB - Small size, hardware-only, custom data processing cores connected to a host processor are increasingly considered in digital systems design to provide the ability for accelerating data processing operations through hardware acceleration and parallel processing. These can be realized in different forms such as a custom core connected to a host processor on the same die as the processor, as a separate die (e.g., a chiplet) within the same package as the processor or as a separate Integrated Circuit. These require advanced design flows, low-geometry fabrication processes, and suitable test circuit insertion to implement a suitable test strategy. In this paper, the testability of custom hardware cores is considered through test circuit insertion based on the IJTAG standard. The core is to perform data processing operations based on the Mathematics of Arrays and serial communications is based on the Serial Peripheral Interface. This interface is used for both normal operating mode and the IJTAG based test mode. The system design is considered at the pre-synthesis design development stage and identifies architectural considerations for such system designs.
KW - Built-In Self-Test
KW - Design for Testability
KW - Internal JTAG
KW - Mathematics of Arrays
KW - Test
UR - https://www.scopus.com/pages/publications/105007145673
U2 - 10.1109/iEECON64081.2025.10987900
DO - 10.1109/iEECON64081.2025.10987900
M3 - Conference contribution
AN - SCOPUS:105007145673
T3 - Proceedings - iEECON 2025: 2025 13th International Electrical Engineering Congress: Carbon Neutrality: Challenges and Solutions Based on Sustainable Power of Nature
BT - Proceedings - iEECON 2025
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 13th International Electrical Engineering Congress, iEECON 2025
Y2 - 5 May 2025 through 7 May 2025
ER -