Developing a Test Strategy for Mathematics of Arrays Computation Cores

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Small size, hardware-only, custom data processing cores connected to a host processor are increasingly considered in digital systems design to provide the ability for accelerating data processing operations through hardware acceleration and parallel processing. These can be realized in different forms such as a custom core connected to a host processor on the same die as the processor, as a separate die (e.g., a chiplet) within the same package as the processor or as a separate Integrated Circuit. These require advanced design flows, low-geometry fabrication processes, and suitable test circuit insertion to implement a suitable test strategy. In this paper, the testability of custom hardware cores is considered through test circuit insertion based on the IJTAG standard. The core is to perform data processing operations based on the Mathematics of Arrays and serial communications is based on the Serial Peripheral Interface. This interface is used for both normal operating mode and the IJTAG based test mode. The system design is considered at the pre-synthesis design development stage and identifies architectural considerations for such system designs.

Original languageEnglish
Title of host publicationProceedings - iEECON 2025
Subtitle of host publication2025 13th International Electrical Engineering Congress: Carbon Neutrality: Challenges and Solutions Based on Sustainable Power of Nature
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798331543952
DOIs
Publication statusPublished - 2025
Event13th International Electrical Engineering Congress, iEECON 2025 - Hua Hin, Thailand
Duration: 5 May 20257 May 2025

Publication series

NameProceedings - iEECON 2025: 2025 13th International Electrical Engineering Congress: Carbon Neutrality: Challenges and Solutions Based on Sustainable Power of Nature

Conference

Conference13th International Electrical Engineering Congress, iEECON 2025
Country/TerritoryThailand
CityHua Hin
Period5/05/257/05/25

Keywords

  • Built-In Self-Test
  • Design for Testability
  • Internal JTAG
  • Mathematics of Arrays
  • Test

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