Development of an electronic speckle pattern interferometer for measurement of concentration gradients in a binary mixture

David Mc Guire, Julie Garvey, Tara M. Dalton, Mark R. Davies

Research output: Contribution to conferencePaperpeer-review

Abstract

This paper describes the construction and performance of an Electronic Speckle Pattern Interferometer (ESPI) developed for measurements of concentration gradients in a binary mixture. The system uses a Mach-Zehnder interferometer with a commercially available CCD camera for image acquisition. A phase-shifting algorithm is employed to give full field measurements. The theoretical background to the optical process involved in these methods is also presented, with emphasis on using the system for analysing concentration gradients. Problems pertaining to the unknown Gladstone-Dale constants of a binary mixture are also discussed. copyright

Original languageEnglish
Pages407-412
Number of pages6
DOIs
Publication statusPublished - 2004
EventProceedings of the ASME Heat Transfer/Fluids Engineering Summer Conference 2004, HT/FED 2004 - Charlotte, NC, United States
Duration: 11 Jul 200415 Jul 2004

Conference

ConferenceProceedings of the ASME Heat Transfer/Fluids Engineering Summer Conference 2004, HT/FED 2004
Country/TerritoryUnited States
CityCharlotte, NC
Period11/07/0415/07/04

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