Direct Observation of the Conventional Epitaxial and Novel Heteroaxial ZB-WZ Stacking Faults

Huan Ren, Yuanwei Sun, Peng Gao, Kevin M. Ryan

Research output: Contribution to journalArticlepeer-review

Abstract

Compared to the conventional ZB-WZ stacking fault that aligns with the crystal growth axis, a novel heteroaxial ZB-WZ stacking fault axis that intercepts the growth axis by 70.3° is observed and analyzed in this report. The formation of the reported heteroaxial ZB-WZ stacking fault is attributed to the nanocrystals’ tendency to achieve the lowest possible systematic disorder by avoiding atomic array distortion at the intersection of two tetrahedral polytypic interphases.

Original languageEnglish
Pages (from-to)5384-5388
Number of pages5
JournalCrystal Growth and Design
Volume23
Issue number8
DOIs
Publication statusPublished - 2 Aug 2023

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