Direct Observation of the Conventional Epitaxial and Novel Heteroaxial ZB-WZ Stacking Faults

Huan Ren, Yuanwei Sun, Peng Gao, Kevin M. Ryan

    Research output: Contribution to journalArticlepeer-review

    Abstract

    Compared to the conventional ZB-WZ stacking fault that aligns with the crystal growth axis, a novel heteroaxial ZB-WZ stacking fault axis that intercepts the growth axis by 70.3° is observed and analyzed in this report. The formation of the reported heteroaxial ZB-WZ stacking fault is attributed to the nanocrystals’ tendency to achieve the lowest possible systematic disorder by avoiding atomic array distortion at the intersection of two tetrahedral polytypic interphases.

    Original languageEnglish
    Pages (from-to)5384-5388
    Number of pages5
    JournalCrystal Growth and Design
    Volume23
    Issue number8
    DOIs
    Publication statusPublished - 2 Aug 2023

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