TY - GEN
T1 - Dynamic-adaptive field induced charged device model (FICDM) compact tester model
AU - Weyl, Thorsten
AU - Clarke, Dave
AU - Rinne, Karl
PY - 2008
Y1 - 2008
N2 - This paper introduces a compact FICDM tester model that includes all prominent tester parasitics and discharge arc behaviours. Geometry variations between different Devices Under Test (DUTs) and associated changes in tester capacitances are accounted for. The variation of ground plane capacitances during the approach of the pogo pin towards the DUT and prior to discharge are also modeled. The tester model was verified across an extensive range of test voltages and DUT capacitances.
AB - This paper introduces a compact FICDM tester model that includes all prominent tester parasitics and discharge arc behaviours. Geometry variations between different Devices Under Test (DUTs) and associated changes in tester capacitances are accounted for. The variation of ground plane capacitances during the approach of the pogo pin towards the DUT and prior to discharge are also modeled. The tester model was verified across an extensive range of test voltages and DUT capacitances.
UR - http://www.scopus.com/inward/record.url?scp=60649121811&partnerID=8YFLogxK
U2 - 10.1109/ICSICT.2008.4734570
DO - 10.1109/ICSICT.2008.4734570
M3 - Conference contribution
AN - SCOPUS:60649121811
SN - 9781424421855
T3 - International Conference on Solid-State and Integrated Circuits Technology Proceedings, ICSICT
SP - 444
EP - 447
BT - ICSICT 2008 - 2008 9th International Conference on Solid-State and Integrated-Circuit Technology Proceedings
T2 - 2008 9th International Conference on Solid-State and Integrated-Circuit Technology, ICSICT 2008
Y2 - 20 October 2008 through 23 October 2008
ER -