Original language | English |
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Pages (from-to) | 886-887 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 10 |
Issue number | SUPPL. 2 |
DOIs | |
Publication status | Published - 2004 |
Externally published | Yes |
EEL spectrum imaging of extended defects in diamond using UHV Enfina in a dedicated STEM
U. Bangert, A. J. Harvey, R. Jones, C. J. Fall, A. Papworth
Research output: Contribution to journal › Article › peer-review