EEL spectrum imaging of extended defects in diamond using UHV Enfina in a dedicated STEM

U. Bangert, A. J. Harvey, R. Jones, C. J. Fall, A. Papworth

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)886-887
Number of pages2
JournalMicroscopy and Microanalysis
Volume10
Issue numberSUPPL. 2
DOIs
Publication statusPublished - 2004
Externally publishedYes

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