| Original language | English |
|---|---|
| Pages (from-to) | 886-887 |
| Number of pages | 2 |
| Journal | Microscopy and Microanalysis |
| Volume | 10 |
| Issue number | SUPPL. 2 |
| DOIs | |
| Publication status | Published - 2004 |
| Externally published | Yes |
EEL spectrum imaging of extended defects in diamond using UHV Enfina in a dedicated STEM
- U. Bangert
- , A. J. Harvey
- , R. Jones
- , C. J. Fall
- , A. Papworth
Research output: Contribution to journal › Article › peer-review