Electronic structure modification of boron and nitrogen ion-implanted graphene fingerprinted by STEM-EELS

D. M. Kepaptsoglou; C. R. Seabourne; T. Hardcastle; R. Nicholls; W. Pierce; R. Zan; U. Bangert; A. J. Scott; Q. M. Ramasse

doi:10.1017/S143192761401040X

Electronic structure modification of boron and nitrogen ion-implanted graphene fingerprinted by STEM-EELS

D. M. Kepaptsoglou, C. R. Seabourne, T. Hardcastle, R. Nicholls, W. Pierce, R. Zan, U. Bangert, A. J. Scott, Q. M. Ramasse

Retired Staff

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	1734-1735
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S143192761401040X
Publication status	Published - 1 Aug 2014
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: 3 Aug 2014 → 7 Aug 2014

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10.1017/S143192761401040X

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@article{2fc528847e4b4eb88c46d18c0b39cc7e,

title = "Electronic structure modification of boron and nitrogen ion-implanted graphene fingerprinted by STEM-EELS",

author = "Kepaptsoglou, {D. M.} and Seabourne, {C. R.} and T. Hardcastle and R. Nicholls and W. Pierce and R. Zan and U. Bangert and Scott, {A. J.} and Ramasse, {Q. M.}",

year = "2014",

month = aug,

day = "1",

doi = "10.1017/S143192761401040X",

language = "English",

volume = "20",

pages = "1734--1735",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

number = "3",

note = "Microscopy and Microanalysis 2014, M and M 2014 ; Conference date: 03-08-2014 Through 07-08-2014",

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TY - JOUR

T1 - Electronic structure modification of boron and nitrogen ion-implanted graphene fingerprinted by STEM-EELS

AU - Kepaptsoglou, D. M.

AU - Seabourne, C. R.

AU - Hardcastle, T.

AU - Nicholls, R.

AU - Pierce, W.

AU - Zan, R.

AU - Bangert, U.

AU - Scott, A. J.

AU - Ramasse, Q. M.

PY - 2014/8/1

Y1 - 2014/8/1

UR - http://www.scopus.com/inward/record.url?scp=84927936143&partnerID=8YFLogxK

U2 - 10.1017/S143192761401040X

DO - 10.1017/S143192761401040X

M3 - Conference article

AN - SCOPUS:84927936143

SN - 1431-9276

VL - 20

SP - 1734

EP - 1735

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

T2 - Microscopy and Microanalysis 2014, M and M 2014

Y2 - 3 August 2014 through 7 August 2014

ER -

Electronic structure modification of boron and nitrogen ion-implanted graphene fingerprinted by STEM-EELS

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