| Original language | English |
|---|---|
| Pages (from-to) | 1734-1735 |
| Number of pages | 2 |
| Journal | Microscopy and Microanalysis |
| Volume | 20 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 1 Aug 2014 |
| Event | Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: 3 Aug 2014 → 7 Aug 2014 |
Electronic structure modification of boron and nitrogen ion-implanted graphene fingerprinted by STEM-EELS
D. M. Kepaptsoglou, C. R. Seabourne, T. Hardcastle, R. Nicholls, W. Pierce, R. Zan, U. Bangert, A. J. Scott, Q. M. Ramasse
Research output: Contribution to journal › Conference article › peer-review