Abstract
LEDs with enhanced light extraction efficiency and sensors with improved sensitivity have been developed using porous semiconductors. Here, the growth of porous GaN epitaxial layers oriented along the [0001] crystallographic direction on Al2O3, SiC, AlN and GaN substrates is demonstrated. A lattice mismatch between the substrate and the porous GaN layer directly affects the structure and porosity of the porous GaN layer on each substrate. Deposition of unintentionally doped n-type porous GaN on non-porous p-type GaN layers allows for the fabrication of high quality rectifying p-n junctions, with potential applications in high brightness unencapsulated GaN-based light emitting diodes and high surface area wide band gap sensor devices.
Original language | English |
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Pages (from-to) | 10255-10261 |
Number of pages | 7 |
Journal | CrystEngComm |
Volume | 16 |
Issue number | 44 |
DOIs | |
Publication status | Published - 28 Nov 2014 |
Externally published | Yes |