Erratum: High density and patternable growth of silicon, germanium and alloyed SiGe nanowires by a rapid anneal protocol (Journal of Materials Chemistry C (2015) 3 (7455-7462))

M. Bezuidenhout, T. Kennedy, S. Belochapkine, Y. Guo, E. Mullane, P. A. Kiely, K. M. Ryan

Research output: Contribution to journalComment/debate

Original languageEnglish
Pages (from-to)8434
Number of pages1
JournalJournal of Materials Chemistry C
Volume3
Issue number32
DOIs
Publication statusPublished - 14 Jul 2015

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