Evidence for the presence of Eu2+ in (Y,Eu)-Si-Al-O-N glass by luminescence spectroscopy

H. T. Hintzen; J. W.H. Van Krevel; D. De Graaf; R. Metselaar; Y. Menke; S. Hampshire

doi:10.1023/B:JMSC.0000017797.45756.b1

Evidence for the presence of Eu²⁺ in (Y,Eu)-Si-Al-O-N glass by luminescence spectroscopy

H. T. Hintzen, J. W.H. Van Krevel, D. De Graaf, R. Metselaar, Y. Menke, S. Hampshire

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Abstract

The evidence for the presence of Eu²⁺ in (Y,Eu)-Si-Al-O-N glass was studied by luminescence spectroscopy. It was observed that the (Y,Eu)-Si-Al-O-N glass shows a band centered around 450 nm, which was typical for transitions from the 5d to the 4f level of divalent Eu. The deviating behavior of the Eu-Si-Al-O-N glass with respect to mechanical properties of Ln-Si-Al-O-N glasses in which the lanthanides ion Ln was present in the trivalent state was also studied. It was found that the bandwidth of the Eu ²⁺ emission was about 5000-6000 cm^-1 which was about the same halfwidth as observed for Eu²⁺ present on a single site in crystalline silicate and aluminate materials.

Original language	English
Pages (from-to)	2237-2238
Number of pages	2
Journal	Journal of Materials Science
Volume	39
Issue number	6
DOIs	https://doi.org/10.1023/B:JMSC.0000017797.45756.b1
Publication status	Published - 15 Mar 2004

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title = "Evidence for the presence of Eu2+ in (Y,Eu)-Si-Al-O-N glass by luminescence spectroscopy",

abstract = "The evidence for the presence of Eu2+ in (Y,Eu)-Si-Al-O-N glass was studied by luminescence spectroscopy. It was observed that the (Y,Eu)-Si-Al-O-N glass shows a band centered around 450 nm, which was typical for transitions from the 5d to the 4f level of divalent Eu. The deviating behavior of the Eu-Si-Al-O-N glass with respect to mechanical properties of Ln-Si-Al-O-N glasses in which the lanthanides ion Ln was present in the trivalent state was also studied. It was found that the bandwidth of the Eu 2+ emission was about 5000-6000 cm-1 which was about the same halfwidth as observed for Eu2+ present on a single site in crystalline silicate and aluminate materials.",

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T1 - Evidence for the presence of Eu2+ in (Y,Eu)-Si-Al-O-N glass by luminescence spectroscopy

AU - Hintzen, H. T.

AU - Van Krevel, J. W.H.

AU - De Graaf, D.

AU - Metselaar, R.

AU - Menke, Y.

AU - Hampshire, S.

PY - 2004/3/15

Y1 - 2004/3/15

N2 - The evidence for the presence of Eu2+ in (Y,Eu)-Si-Al-O-N glass was studied by luminescence spectroscopy. It was observed that the (Y,Eu)-Si-Al-O-N glass shows a band centered around 450 nm, which was typical for transitions from the 5d to the 4f level of divalent Eu. The deviating behavior of the Eu-Si-Al-O-N glass with respect to mechanical properties of Ln-Si-Al-O-N glasses in which the lanthanides ion Ln was present in the trivalent state was also studied. It was found that the bandwidth of the Eu 2+ emission was about 5000-6000 cm-1 which was about the same halfwidth as observed for Eu2+ present on a single site in crystalline silicate and aluminate materials.

AB - The evidence for the presence of Eu2+ in (Y,Eu)-Si-Al-O-N glass was studied by luminescence spectroscopy. It was observed that the (Y,Eu)-Si-Al-O-N glass shows a band centered around 450 nm, which was typical for transitions from the 5d to the 4f level of divalent Eu. The deviating behavior of the Eu-Si-Al-O-N glass with respect to mechanical properties of Ln-Si-Al-O-N glasses in which the lanthanides ion Ln was present in the trivalent state was also studied. It was found that the bandwidth of the Eu 2+ emission was about 5000-6000 cm-1 which was about the same halfwidth as observed for Eu2+ present on a single site in crystalline silicate and aluminate materials.

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JO - Journal of Materials Science

JF - Journal of Materials Science

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ER -

Evidence for the presence of Eu²⁺ in (Y,Eu)-Si-Al-O-N glass by luminescence spectroscopy

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