Evidence for the presence of Eu2+ in (Y,Eu)-Si-Al-O-N glass by luminescence spectroscopy

H. T. Hintzen; J. W.H. Van Krevel; D. De Graaf; R. Metselaar; Y. Menke; S. Hampshire

doi:10.1023/B:JMSC.0000017797.45756.b1

Evidence for the presence of Eu²⁺ in (Y,Eu)-Si-Al-O-N glass by luminescence spectroscopy

H. T. Hintzen
, J. W.H. Van Krevel
, D. De Graaf
, R. Metselaar
, Y. Menke
, S. Hampshire

Retired Staff

Research output: Contribution to journal › Article › peer-review

Abstract

The evidence for the presence of Eu²⁺ in (Y,Eu)-Si-Al-O-N glass was studied by luminescence spectroscopy. It was observed that the (Y,Eu)-Si-Al-O-N glass shows a band centered around 450 nm, which was typical for transitions from the 5d to the 4f level of divalent Eu. The deviating behavior of the Eu-Si-Al-O-N glass with respect to mechanical properties of Ln-Si-Al-O-N glasses in which the lanthanides ion Ln was present in the trivalent state was also studied. It was found that the bandwidth of the Eu ²⁺ emission was about 5000-6000 cm^-1 which was about the same halfwidth as observed for Eu²⁺ present on a single site in crystalline silicate and aluminate materials.

Original language	English
Pages (from-to)	2237-2238
Number of pages	2
Journal	Journal of Materials Science
Volume	39
Issue number	6
DOIs	https://doi.org/10.1023/B:JMSC.0000017797.45756.b1
Publication status	Published - 15 Mar 2004

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title = "Evidence for the presence of Eu2+ in (Y,Eu)-Si-Al-O-N glass by luminescence spectroscopy",

abstract = "The evidence for the presence of Eu2+ in (Y,Eu)-Si-Al-O-N glass was studied by luminescence spectroscopy. It was observed that the (Y,Eu)-Si-Al-O-N glass shows a band centered around 450 nm, which was typical for transitions from the 5d to the 4f level of divalent Eu. The deviating behavior of the Eu-Si-Al-O-N glass with respect to mechanical properties of Ln-Si-Al-O-N glasses in which the lanthanides ion Ln was present in the trivalent state was also studied. It was found that the bandwidth of the Eu 2+ emission was about 5000-6000 cm-1 which was about the same halfwidth as observed for Eu2+ present on a single site in crystalline silicate and aluminate materials.",

author = "Hintzen, \{H. T.\} and \{Van Krevel\}, \{J. W.H.\} and \{De Graaf\}, D. and R. Metselaar and Y. Menke and S. Hampshire",

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doi = "10.1023/B:JMSC.0000017797.45756.b1",

language = "English",

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TY - JOUR

T1 - Evidence for the presence of Eu2+ in (Y,Eu)-Si-Al-O-N glass by luminescence spectroscopy

AU - Hintzen, H. T.

AU - Van Krevel, J. W.H.

AU - De Graaf, D.

AU - Metselaar, R.

AU - Menke, Y.

AU - Hampshire, S.

PY - 2004/3/15

Y1 - 2004/3/15

N2 - The evidence for the presence of Eu2+ in (Y,Eu)-Si-Al-O-N glass was studied by luminescence spectroscopy. It was observed that the (Y,Eu)-Si-Al-O-N glass shows a band centered around 450 nm, which was typical for transitions from the 5d to the 4f level of divalent Eu. The deviating behavior of the Eu-Si-Al-O-N glass with respect to mechanical properties of Ln-Si-Al-O-N glasses in which the lanthanides ion Ln was present in the trivalent state was also studied. It was found that the bandwidth of the Eu 2+ emission was about 5000-6000 cm-1 which was about the same halfwidth as observed for Eu2+ present on a single site in crystalline silicate and aluminate materials.

AB - The evidence for the presence of Eu2+ in (Y,Eu)-Si-Al-O-N glass was studied by luminescence spectroscopy. It was observed that the (Y,Eu)-Si-Al-O-N glass shows a band centered around 450 nm, which was typical for transitions from the 5d to the 4f level of divalent Eu. The deviating behavior of the Eu-Si-Al-O-N glass with respect to mechanical properties of Ln-Si-Al-O-N glasses in which the lanthanides ion Ln was present in the trivalent state was also studied. It was found that the bandwidth of the Eu 2+ emission was about 5000-6000 cm-1 which was about the same halfwidth as observed for Eu2+ present on a single site in crystalline silicate and aluminate materials.

UR - https://www.scopus.com/pages/publications/1842587415

U2 - 10.1023/B:JMSC.0000017797.45756.b1

DO - 10.1023/B:JMSC.0000017797.45756.b1

M3 - Article

AN - SCOPUS:1842587415

SN - 0022-2461

VL - 39

SP - 2237

EP - 2238

JO - Journal of Materials Science

JF - Journal of Materials Science

IS - 6

ER -

Evidence for the presence of Eu²⁺ in (Y,Eu)-Si-Al-O-N glass by luminescence spectroscopy

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