EVM measurement of modulation fidelity of π/4 DQPSK baseband modulators

M. S. O'Droma; M. Keaveney

doi:10.1080/00207210410001712156

EVM measurement of modulation fidelity of π/4 DQPSK baseband modulators

M. S. O'Droma, M. Keaveney

Retired Staff

Analog Devices, Inc.

Research output: Contribution to journal › Article › peer-review

Abstract

An algorithm for the calculation of optimized error vector magnitude (EVM) and offset vector magnitude (OVM) parameters for m-ary PSK baseband modulators (BMs) is presented. It does not require the regeneration of an ideal reference signal but is based on a mixed time and frequency domain software digital signal processing of a short (256 symbol) random data test signal. The frequency domain processing is required for phase rotation compensation. An automatic test equipment (ATE) implementation of the algorithm as part of an IS-136 π/4 DQPSK baseband modulator IC production line quality control is described, together with some typical measurement results.

Original language	English
Pages (from-to)	377-384
Number of pages	8
Journal	International Journal of Electronics
Volume	91
Issue number	6
DOIs	https://doi.org/10.1080/00207210410001712156
Publication status	Published - Jun 2004

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EVM measurement of modulation fidelity of π/4 DQPSK baseband modulators

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