TY - JOUR
T1 - Fabrication of magnetic force microscopy tips via electrodeposition and focused ion beam milling
AU - Céspedes, O.
AU - Luu, A.
AU - Rhen, F. M.F.
AU - Coey, J. M.D.
PY - 2008/11
Y1 - 2008/11
N2 - A method is described for the fabrication of magnetic force microscopy tips via localized electrodeposition and focused ion beam milling departing from commercial tapping mode tips. Very high aspect ratios and interacting magnetic moments are possible without altering significantly the tapping resonant frequency of the cantilever. These tips can achieve high magnetic resolution at room temperature and open atmosphere. They can also be fabricated into any shape, with applications for ferromagnetic resonance measurements and nano-imprinting.
AB - A method is described for the fabrication of magnetic force microscopy tips via localized electrodeposition and focused ion beam milling departing from commercial tapping mode tips. Very high aspect ratios and interacting magnetic moments are possible without altering significantly the tapping resonant frequency of the cantilever. These tips can achieve high magnetic resolution at room temperature and open atmosphere. They can also be fabricated into any shape, with applications for ferromagnetic resonance measurements and nano-imprinting.
KW - Electrodeposition
KW - Focused ion beam milling
KW - Magnetic force microscopy (mfm)
KW - Tip fabrication
UR - http://www.scopus.com/inward/record.url?scp=85130087677&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/record.url?scp=77955113153&partnerID=8YFLogxK
U2 - 10.1109/TMAG.2008.2002866
DO - 10.1109/TMAG.2008.2002866
M3 - Article
AN - SCOPUS:77955113153
SN - 0018-9464
VL - 44
SP - 3248
EP - 3251
JO - IEEE Transactions on Magnetics
JF - IEEE Transactions on Magnetics
IS - 11 PART 2
ER -