Fabrication of magnetic force microscopy tips via electrodeposition and focused ion beam milling

O. Céspedes; A. Luu; F. M.F. Rhen; J. M.D. Coey

doi:10.1109/TMAG.2008.2002866

Fabrication of magnetic force microscopy tips via electrodeposition and focused ion beam milling

O. Céspedes, A. Luu, F. M.F. Rhen, J. M.D. Coey

Trinity College Dublin

Research output: Contribution to journal › Article › peer-review

Abstract

A method is described for the fabrication of magnetic force microscopy tips via localized electrodeposition and focused ion beam milling departing from commercial tapping mode tips. Very high aspect ratios and interacting magnetic moments are possible without altering significantly the tapping resonant frequency of the cantilever. These tips can achieve high magnetic resolution at room temperature and open atmosphere. They can also be fabricated into any shape, with applications for ferromagnetic resonance measurements and nano-imprinting.

Original language	English
Pages (from-to)	3248-3251
Number of pages	4
Journal	IEEE Transactions on Magnetics
Volume	44
Issue number	11 PART 1
DOIs	https://doi.org/10.1109/TMAG.2008.2002866
Publication status	Published - Nov 2008
Externally published	Yes

Keywords

Electrodeposition
Focused ion beam milling
Magnetic force microscopy (MFM)
Tip fabrication

Access to Document

10.1109/TMAG.2008.2002866

Cite this

@article{fe6de62659d9412890a2dde0d6b7254b,

title = "Fabrication of magnetic force microscopy tips via electrodeposition and focused ion beam milling",

abstract = "A method is described for the fabrication of magnetic force microscopy tips via localized electrodeposition and focused ion beam milling departing from commercial tapping mode tips. Very high aspect ratios and interacting magnetic moments are possible without altering significantly the tapping resonant frequency of the cantilever. These tips can achieve high magnetic resolution at room temperature and open atmosphere. They can also be fabricated into any shape, with applications for ferromagnetic resonance measurements and nano-imprinting.",

keywords = "Electrodeposition, Focused ion beam milling, Magnetic force microscopy (MFM), Tip fabrication",

author = "O. C{\'e}spedes and A. Luu and Rhen, {F. M.F.} and Coey, {J. M.D.}",

year = "2008",

month = nov,

doi = "10.1109/TMAG.2008.2002866",

language = "English",

volume = "44",

pages = "3248--3251",

journal = "IEEE Transactions on Magnetics",

issn = "0018-9464",

number = "11 PART 1",

}

TY - JOUR

T1 - Fabrication of magnetic force microscopy tips via electrodeposition and focused ion beam milling

AU - Céspedes, O.

AU - Luu, A.

AU - Rhen, F. M.F.

AU - Coey, J. M.D.

PY - 2008/11

Y1 - 2008/11

N2 - A method is described for the fabrication of magnetic force microscopy tips via localized electrodeposition and focused ion beam milling departing from commercial tapping mode tips. Very high aspect ratios and interacting magnetic moments are possible without altering significantly the tapping resonant frequency of the cantilever. These tips can achieve high magnetic resolution at room temperature and open atmosphere. They can also be fabricated into any shape, with applications for ferromagnetic resonance measurements and nano-imprinting.

AB - A method is described for the fabrication of magnetic force microscopy tips via localized electrodeposition and focused ion beam milling departing from commercial tapping mode tips. Very high aspect ratios and interacting magnetic moments are possible without altering significantly the tapping resonant frequency of the cantilever. These tips can achieve high magnetic resolution at room temperature and open atmosphere. They can also be fabricated into any shape, with applications for ferromagnetic resonance measurements and nano-imprinting.

KW - Electrodeposition

KW - Focused ion beam milling

KW - Magnetic force microscopy (MFM)

KW - Tip fabrication

UR - http://www.scopus.com/inward/record.url?scp=77955113153&partnerID=8YFLogxK

U2 - 10.1109/TMAG.2008.2002866

DO - 10.1109/TMAG.2008.2002866

M3 - Article

AN - SCOPUS:77955113153

SN - 0018-9464

VL - 44

SP - 3248

EP - 3251

JO - IEEE Transactions on Magnetics

JF - IEEE Transactions on Magnetics

IS - 11 PART 1

ER -

Fabrication of magnetic force microscopy tips via electrodeposition and focused ion beam milling

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this