Abstract
Label-free absorption spectroscopies are frontline techniques to reveal the spectral fingerprint, composition and environment of materials and are applicable to a wide range of samples. In an effort to improve the spatial resolution of far-field absorption microscopy, which is limited by the diffraction of light, an imaging technique based on transient absorption saturation has recently been developed. Here we report a far-field transient absorption microscopy that does not require the sample to exhibit saturable absorption to break the diffraction barrier. By alternating the wavefront of the pump beams and exploiting a nonlinearity in the transient absorption intrinsic to semiconductors, we demonstrate imaging, beyond the diffraction limit, in CdSe nanobelts. This differential technique is applied for label-free super-resolution absorption microspectroscopy.
Original language | English |
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Pages (from-to) | 478-485 |
Number of pages | 8 |
Journal | ACS Photonics |
Volume | 3 |
Issue number | 3 |
DOIs | |
Publication status | Published - 16 Mar 2016 |
Keywords
- bleaching
- cadmium selenide
- induced absorption
- label-free
- microspectroscopy
- nanowire
- pump''probe
- super-resolution