TY - GEN
T1 - Flexible FPGA Based Digital IC Test Development Education Laboratory Design and Application
AU - Grout, Ian
N1 - Publisher Copyright:
© 2020 IEEE.
PY - 2020/6
Y1 - 2020/6
N2 - In this paper, a teaching aid for digital integrated circuit (IC) test development engineering education using the field programmable gate array (FPGA) is presented and discussed. The set-up allows for different digital IC test development scenarios to be configured within the FPGA. For analysis and evaluation purposes, embedded machine learning functions could also include automated reporting of the system use. A case study design, using a Xilinx Artix-7 FPGA, incorporating a circuit test set-up for an example digital IC based an implementation of the IEEE Std 1149.1 "IEEE Standard for Test Access Port and Boundary-Scan Architecture"is embedded within the FPGA. This is accessed by the user via a serial port connection. This case study design allows a user to investigate and implement test program development scenarios within a suitable education environment.
AB - In this paper, a teaching aid for digital integrated circuit (IC) test development engineering education using the field programmable gate array (FPGA) is presented and discussed. The set-up allows for different digital IC test development scenarios to be configured within the FPGA. For analysis and evaluation purposes, embedded machine learning functions could also include automated reporting of the system use. A case study design, using a Xilinx Artix-7 FPGA, incorporating a circuit test set-up for an example digital IC based an implementation of the IEEE Std 1149.1 "IEEE Standard for Test Access Port and Boundary-Scan Architecture"is embedded within the FPGA. This is accessed by the user via a serial port connection. This case study design allows a user to investigate and implement test program development scenarios within a suitable education environment.
KW - FPGA
KW - JTAG
KW - machine learning
KW - test engineering
KW - VHDL
UR - http://www.scopus.com/inward/record.url?scp=85091870785&partnerID=8YFLogxK
U2 - 10.1109/ECTI-CON49241.2020.9158091
DO - 10.1109/ECTI-CON49241.2020.9158091
M3 - Conference contribution
AN - SCOPUS:85091870785
T3 - 17th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology, ECTI-CON 2020
SP - 341
EP - 344
BT - 17th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology, ECTI-CON 2020
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 17th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology, ECTI-CON 2020
Y2 - 24 June 2020 through 27 June 2020
ER -
