Flexible FPGA Based Digital IC Test Development Education Laboratory Design and Application

Ian Grout

doi:10.1109/ECTI-CON49241.2020.9158091

Flexible FPGA Based Digital IC Test Development Education Laboratory Design and Application

Ian Grout

Department of Electronics & Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

In this paper, a teaching aid for digital integrated circuit (IC) test development engineering education using the field programmable gate array (FPGA) is presented and discussed. The set-up allows for different digital IC test development scenarios to be configured within the FPGA. For analysis and evaluation purposes, embedded machine learning functions could also include automated reporting of the system use. A case study design, using a Xilinx Artix-7 FPGA, incorporating a circuit test set-up for an example digital IC based an implementation of the IEEE Std 1149.1 "IEEE Standard for Test Access Port and Boundary-Scan Architecture"is embedded within the FPGA. This is accessed by the user via a serial port connection. This case study design allows a user to investigate and implement test program development scenarios within a suitable education environment.

Original language	English
Title of host publication	17th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology, ECTI-CON 2020
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	341-344
Number of pages	4
ISBN (Electronic)	9781728164861
DOIs	https://doi.org/10.1109/ECTI-CON49241.2020.9158091
Publication status	Published - Jun 2020
Event	17th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology, ECTI-CON 2020 - Virtual, Online, Thailand Duration: 24 Jun 2020 → 27 Jun 2020

Publication series

Name	17th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology, ECTI-CON 2020

Conference

Conference	17th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology, ECTI-CON 2020
Country/Territory	Thailand
City	Virtual, Online
Period	24/06/20 → 27/06/20

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 5 Gender Equality

Keywords

FPGA
JTAG
VHDL
machine learning
test engineering

Access to Document

10.1109/ECTI-CON49241.2020.9158091

Cite this

Grout, I. (2020). Flexible FPGA Based Digital IC Test Development Education Laboratory Design and Application. In 17th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology, ECTI-CON 2020 (pp. 341-344). Article 9158091 (17th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology, ECTI-CON 2020). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ECTI-CON49241.2020.9158091

Grout, Ian. / Flexible FPGA Based Digital IC Test Development Education Laboratory Design and Application. 17th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology, ECTI-CON 2020. Institute of Electrical and Electronics Engineers Inc., 2020. pp. 341-344 (17th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology, ECTI-CON 2020).

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abstract = "In this paper, a teaching aid for digital integrated circuit (IC) test development engineering education using the field programmable gate array (FPGA) is presented and discussed. The set-up allows for different digital IC test development scenarios to be configured within the FPGA. For analysis and evaluation purposes, embedded machine learning functions could also include automated reporting of the system use. A case study design, using a Xilinx Artix-7 FPGA, incorporating a circuit test set-up for an example digital IC based an implementation of the IEEE Std 1149.1 {"}IEEE Standard for Test Access Port and Boundary-Scan Architecture{"}is embedded within the FPGA. This is accessed by the user via a serial port connection. This case study design allows a user to investigate and implement test program development scenarios within a suitable education environment.",

keywords = "FPGA, JTAG, VHDL, machine learning, test engineering",

author = "Ian Grout",

note = "Publisher Copyright: {\textcopyright} 2020 IEEE.; 17th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology, ECTI-CON 2020 ; Conference date: 24-06-2020 Through 27-06-2020",

year = "2020",

month = jun,

doi = "10.1109/ECTI-CON49241.2020.9158091",

language = "English",

series = "17th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology, ECTI-CON 2020",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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Grout, I 2020, Flexible FPGA Based Digital IC Test Development Education Laboratory Design and Application. in 17th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology, ECTI-CON 2020., 9158091, 17th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology, ECTI-CON 2020, Institute of Electrical and Electronics Engineers Inc., pp. 341-344, 17th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology, ECTI-CON 2020, Virtual, Online, Thailand, 24/06/20. https://doi.org/10.1109/ECTI-CON49241.2020.9158091

Flexible FPGA Based Digital IC Test Development Education Laboratory Design and Application. / Grout, Ian.
17th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology, ECTI-CON 2020. Institute of Electrical and Electronics Engineers Inc., 2020. p. 341-344 9158091 (17th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology, ECTI-CON 2020).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AB - In this paper, a teaching aid for digital integrated circuit (IC) test development engineering education using the field programmable gate array (FPGA) is presented and discussed. The set-up allows for different digital IC test development scenarios to be configured within the FPGA. For analysis and evaluation purposes, embedded machine learning functions could also include automated reporting of the system use. A case study design, using a Xilinx Artix-7 FPGA, incorporating a circuit test set-up for an example digital IC based an implementation of the IEEE Std 1149.1 "IEEE Standard for Test Access Port and Boundary-Scan Architecture"is embedded within the FPGA. This is accessed by the user via a serial port connection. This case study design allows a user to investigate and implement test program development scenarios within a suitable education environment.

KW - FPGA

KW - JTAG

KW - VHDL

KW - machine learning

KW - test engineering

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M3 - Conference contribution

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Grout I. Flexible FPGA Based Digital IC Test Development Education Laboratory Design and Application. In 17th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology, ECTI-CON 2020. Institute of Electrical and Electronics Engineers Inc. 2020. p. 341-344. 9158091. (17th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology, ECTI-CON 2020). doi: 10.1109/ECTI-CON49241.2020.9158091

Flexible FPGA Based Digital IC Test Development Education Laboratory Design and Application

Abstract

Publication series

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UN SDGs

Keywords

Access to Document

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