Full-field phase measurement by wavelength-tuning interferometry in the C-band

Patrick Egan; Fereydoun Lakestani; Maurice P. Whelan; Michael J. Connelly

doi:10.1117/1.2401169

Full-field phase measurement by wavelength-tuning interferometry in the C-band

Patrick Egan, Fereydoun Lakestani, Maurice P. Whelan, Michael J. Connelly

Department of Electronics & Computer Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

Fluctuations in the output intensity and wavelength of an external cavity diode laser can introduce significant error to wavelength-tuned interferometric measurement. However, a robust phase-retrieval algorithm can compensate for these nonlinearities. Employing an inexpensive phosphor-coated charge-coupled device camera sensitive to C-band infrared, full-field interferometric phase retrieval utilizing wavelength tuning of a 1555 nm external cavity diode laser is reported. Phase measurement of a tilted mirror is presented with an estimated accuracy within 7 nm.

Original language	English
Article number	120504
Journal	Optical Engineering
Volume	45
Issue number	12
DOIs	https://doi.org/10.1117/1.2401169
Publication status	Published - Dec 2006

Keywords

Infrared
Interferometry
Phase measurement
Phase retrieval

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10.1117/1.2401169

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abstract = "Fluctuations in the output intensity and wavelength of an external cavity diode laser can introduce significant error to wavelength-tuned interferometric measurement. However, a robust phase-retrieval algorithm can compensate for these nonlinearities. Employing an inexpensive phosphor-coated charge-coupled device camera sensitive to C-band infrared, full-field interferometric phase retrieval utilizing wavelength tuning of a 1555 nm external cavity diode laser is reported. Phase measurement of a tilted mirror is presented with an estimated accuracy within 7 nm.",

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author = "Patrick Egan and Fereydoun Lakestani and Whelan, {Maurice P.} and Connelly, {Michael J.}",

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AU - Egan, Patrick

AU - Lakestani, Fereydoun

AU - Whelan, Maurice P.

AU - Connelly, Michael J.

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Y1 - 2006/12

N2 - Fluctuations in the output intensity and wavelength of an external cavity diode laser can introduce significant error to wavelength-tuned interferometric measurement. However, a robust phase-retrieval algorithm can compensate for these nonlinearities. Employing an inexpensive phosphor-coated charge-coupled device camera sensitive to C-band infrared, full-field interferometric phase retrieval utilizing wavelength tuning of a 1555 nm external cavity diode laser is reported. Phase measurement of a tilted mirror is presented with an estimated accuracy within 7 nm.

AB - Fluctuations in the output intensity and wavelength of an external cavity diode laser can introduce significant error to wavelength-tuned interferometric measurement. However, a robust phase-retrieval algorithm can compensate for these nonlinearities. Employing an inexpensive phosphor-coated charge-coupled device camera sensitive to C-band infrared, full-field interferometric phase retrieval utilizing wavelength tuning of a 1555 nm external cavity diode laser is reported. Phase measurement of a tilted mirror is presented with an estimated accuracy within 7 nm.

KW - Infrared

KW - Interferometry

KW - Phase measurement

KW - Phase retrieval

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Full-field phase measurement by wavelength-tuning interferometry in the C-band

Abstract

Keywords

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