High angle dark field imaging of two-dimensional crystals

R. Zan; Q. M. Ramasse; R. Jalil; T. Georgiou; U. Bangert; K. S. Novoselov

doi:10.1088/1742-6596/522/1/012077

High angle dark field imaging of two-dimensional crystals

R. Zan, Q. M. Ramasse, R. Jalil, T. Georgiou, U. Bangert, K. S. Novoselov

Research output: Contribution to journal › Conference article › peer-review

Abstract

Two-dimensional (2D) materials, graphene, hexagonal boron nitride (h-BN) and transition metal dichalcogenides (TMD) have been investigated by means of Scanning Transmission Electron Microscopy (STEM), in particular via High Angle Annular Dark Field (HAADF) imaging technique. They are compared in terms of their structure and durability under intense electron beams.

Original language	English
Article number	012077
Journal	Journal of Physics: Conference Series
Volume	522
Issue number	1
DOIs	https://doi.org/10.1088/1742-6596/522/1/012077
Publication status	Published - 2014
Externally published	Yes
Event	Electron Microscopy and Analysis Group Conference 2013, EMAG 2013 - York, United Kingdom Duration: 3 Sep 2013 → 6 Sep 2013

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10.1088/1742-6596/522/1/012077

Cite this

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title = "High angle dark field imaging of two-dimensional crystals",

abstract = "Two-dimensional (2D) materials, graphene, hexagonal boron nitride (h-BN) and transition metal dichalcogenides (TMD) have been investigated by means of Scanning Transmission Electron Microscopy (STEM), in particular via High Angle Annular Dark Field (HAADF) imaging technique. They are compared in terms of their structure and durability under intense electron beams.",

author = "R. Zan and Ramasse, {Q. M.} and R. Jalil and T. Georgiou and U. Bangert and Novoselov, {K. S.}",

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AU - Zan, R.

AU - Ramasse, Q. M.

AU - Jalil, R.

AU - Georgiou, T.

AU - Bangert, U.

AU - Novoselov, K. S.

PY - 2014

Y1 - 2014

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AB - Two-dimensional (2D) materials, graphene, hexagonal boron nitride (h-BN) and transition metal dichalcogenides (TMD) have been investigated by means of Scanning Transmission Electron Microscopy (STEM), in particular via High Angle Annular Dark Field (HAADF) imaging technique. They are compared in terms of their structure and durability under intense electron beams.

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DO - 10.1088/1742-6596/522/1/012077

M3 - Conference article

AN - SCOPUS:84902972109

SN - 1742-6588

VL - 522

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

IS - 1

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T2 - Electron Microscopy and Analysis Group Conference 2013, EMAG 2013

Y2 - 3 September 2013 through 6 September 2013

ER -

High angle dark field imaging of two-dimensional crystals

Abstract

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