Abstract
This article details the analytical electron microscopy techniques that can provide atomically resolved and quantitative chemical compositional as well as physical band structure information on ceramics and glass materials in their solid state. Techniques discussed are: High Angle Annular Dark Field Scanning Transmission Electron Microscopy (HAADF-STEM), integrated Differential Phase Contrast STEM (iDPC-STEM), Energy Dispersive X-Ray Spectroscopy (EDX), Electron Energy Loss Spectroscopy (EELS). The aim of this article is to provide the necessary details required to carry out basic and advanced spectroscopic characterization of ceramic and glass materials supplemented by examples, showing also, how image simulations and unit cell models can corroborate experimental observations.
| Original language | English |
|---|---|
| Title of host publication | Encyclopedia of Materials |
| Subtitle of host publication | Technical Ceramics and Glasses |
| Publisher | Elsevier |
| Pages | 600-617 |
| Number of pages | 18 |
| Volume | 1-3 |
| ISBN (Electronic) | 9780128222331 |
| ISBN (Print) | 9780128185421 |
| DOIs | |
| Publication status | Published - 24 May 2021 |
Keywords
- Analytical Electron Microscopy (AEM)
- Annular Dark Field (ADF)
- Bright Field Scanning Transmission Electron Microscopy (BF-STEM)
- Electron Energy Loss Spectroscopy (EELS)
- Electron Microscopy (EM)
- Energy Dispersive X-Ray Spectroscopy (EDX/EDS/EDXS)
- High Angle Annular Dark Field (HAADF)
- Integrated Differential Phase Contrast (iDPC)
- Transmission Electron Microscopy (TEM