High-resolution quantitative determination of dielectric function by using scattering scanning near-field optical microscopy

D. E. Tranca; S. G. Stanciu; R. Hristu; C. Stoichita; S. A.M. Tofail; G. A. Stanciu

doi:10.1038/srep11876

High-resolution quantitative determination of dielectric function by using scattering scanning near-field optical microscopy

D. E. Tranca, S. G. Stanciu, R. Hristu, C. Stoichita, S. A.M. Tofail, G. A. Stanciu

Department of Physics

University Politehnica of Bucharest

Research output: Contribution to journal › Article › peer-review

Abstract

A new method for high-resolution quantitative measurement of the dielectric function by using scattering scanning near-field optical microscopy (s-SNOM) is presented. The method is based on a calibration procedure that uses the s-SNOM oscillating dipole model of the probe-sample interaction and quantitative s-SNOM measurements. The nanoscale capabilities of the method have the potential to enable novel applications in various fields such as nano-electronics, nano-photonics, biology or medicine.

Original language	English
Article number	11876
Pages (from-to)	11876
Journal	Scientific Reports
Volume	5
DOIs	https://doi.org/10.1038/srep11876
Publication status	Published - 3 Jul 2015

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10.1038/srep11876

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abstract = "A new method for high-resolution quantitative measurement of the dielectric function by using scattering scanning near-field optical microscopy (s-SNOM) is presented. The method is based on a calibration procedure that uses the s-SNOM oscillating dipole model of the probe-sample interaction and quantitative s-SNOM measurements. The nanoscale capabilities of the method have the potential to enable novel applications in various fields such as nano-electronics, nano-photonics, biology or medicine.",

author = "Tranca, {D. E.} and Stanciu, {S. G.} and R. Hristu and C. Stoichita and Tofail, {S. A.M.} and Stanciu, {G. A.}",

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AU - Tranca, D. E.

AU - Stanciu, S. G.

AU - Hristu, R.

AU - Stoichita, C.

AU - Tofail, S. A.M.

AU - Stanciu, G. A.

PY - 2015/7/3

Y1 - 2015/7/3

N2 - A new method for high-resolution quantitative measurement of the dielectric function by using scattering scanning near-field optical microscopy (s-SNOM) is presented. The method is based on a calibration procedure that uses the s-SNOM oscillating dipole model of the probe-sample interaction and quantitative s-SNOM measurements. The nanoscale capabilities of the method have the potential to enable novel applications in various fields such as nano-electronics, nano-photonics, biology or medicine.

AB - A new method for high-resolution quantitative measurement of the dielectric function by using scattering scanning near-field optical microscopy (s-SNOM) is presented. The method is based on a calibration procedure that uses the s-SNOM oscillating dipole model of the probe-sample interaction and quantitative s-SNOM measurements. The nanoscale capabilities of the method have the potential to enable novel applications in various fields such as nano-electronics, nano-photonics, biology or medicine.

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ER -

High-resolution quantitative determination of dielectric function by using scattering scanning near-field optical microscopy

Abstract

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