High-resolution quantitative determination of dielectric function by using scattering scanning near-field optical microscopy
- D. E. Tranca
- , S. G. Stanciu
- , R. Hristu
- , C. Stoichita
- , S. A.M. Tofail
- , G. A. Stanciu
- University Politehnica of Bucharest
Research output: Contribution to journal › Article › peer-review