In-situ observation and atomic resolution imaging of the ion irradiation induced amorphisation of graphene

C. T. Pan, J. A. Hinks, Q. M. Ramasse, G. Greaves, U. Bangert, S. E. Donnelly, S. J. Haigh

Research output: Contribution to journalArticlepeer-review

Abstract

Ion irradiation has been observed to induce a macroscopic flattening and in-plane shrinkage of graphene sheets without a complete loss of crystallinity. Electron diffraction studies performed during simultaneous in-situ ion irradiation have allowed identification of the fluence at which the graphene sheet loses long-range order. This approach has facilitated complementary ex-situ investigations, allowing the first atomic resolution scanning transmission electron microscopy images of ion-irradiation induced graphene defect structures together with quantitative analysis of defect densities using Raman spectroscopy.

Original languageEnglish
Article number6334
Pages (from-to)6334
JournalScientific Reports
Volume4
DOIs
Publication statusPublished - 2014

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