In-situ observation and atomic resolution imaging of the ion irradiation induced amorphisation of graphene

C. T. Pan; J. A. Hinks; Q. M. Ramasse; G. Greaves; U. Bangert; S. E. Donnelly; S. J. Haigh

doi:10.1038/srep06334

In-situ observation and atomic resolution imaging of the ion irradiation induced amorphisation of graphene

C. T. Pan
, J. A. Hinks
, Q. M. Ramasse
, G. Greaves
, U. Bangert
, S. E. Donnelly
, S. J. Haigh

Research output: Contribution to journal › Article › peer-review

Abstract

Ion irradiation has been observed to induce a macroscopic flattening and in-plane shrinkage of graphene sheets without a complete loss of crystallinity. Electron diffraction studies performed during simultaneous in-situ ion irradiation have allowed identification of the fluence at which the graphene sheet loses long-range order. This approach has facilitated complementary ex-situ investigations, allowing the first atomic resolution scanning transmission electron microscopy images of ion-irradiation induced graphene defect structures together with quantitative analysis of defect densities using Raman spectroscopy.

Original language	English
Article number	6334
Journal	Scientific Reports
Volume	4
DOIs	https://doi.org/10.1038/srep06334
Publication status	Published - 2014

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10.1038/srep06334

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title = "In-situ observation and atomic resolution imaging of the ion irradiation induced amorphisation of graphene",

abstract = "Ion irradiation has been observed to induce a macroscopic flattening and in-plane shrinkage of graphene sheets without a complete loss of crystallinity. Electron diffraction studies performed during simultaneous in-situ ion irradiation have allowed identification of the fluence at which the graphene sheet loses long-range order. This approach has facilitated complementary ex-situ investigations, allowing the first atomic resolution scanning transmission electron microscopy images of ion-irradiation induced graphene defect structures together with quantitative analysis of defect densities using Raman spectroscopy.",

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AU - Pan, C. T.

AU - Hinks, J. A.

AU - Ramasse, Q. M.

AU - Greaves, G.

AU - Bangert, U.

AU - Donnelly, S. E.

AU - Haigh, S. J.

PY - 2014

Y1 - 2014

N2 - Ion irradiation has been observed to induce a macroscopic flattening and in-plane shrinkage of graphene sheets without a complete loss of crystallinity. Electron diffraction studies performed during simultaneous in-situ ion irradiation have allowed identification of the fluence at which the graphene sheet loses long-range order. This approach has facilitated complementary ex-situ investigations, allowing the first atomic resolution scanning transmission electron microscopy images of ion-irradiation induced graphene defect structures together with quantitative analysis of defect densities using Raman spectroscopy.

AB - Ion irradiation has been observed to induce a macroscopic flattening and in-plane shrinkage of graphene sheets without a complete loss of crystallinity. Electron diffraction studies performed during simultaneous in-situ ion irradiation have allowed identification of the fluence at which the graphene sheet loses long-range order. This approach has facilitated complementary ex-situ investigations, allowing the first atomic resolution scanning transmission electron microscopy images of ion-irradiation induced graphene defect structures together with quantitative analysis of defect densities using Raman spectroscopy.

UR - https://www.scopus.com/pages/publications/84923284213

U2 - 10.1038/srep06334

DO - 10.1038/srep06334

M3 - Article

AN - SCOPUS:84923284213

VL - 4

JO - Scientific Reports

JF - Scientific Reports

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ER -

In-situ observation and atomic resolution imaging of the ion irradiation induced amorphisation of graphene

Abstract

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