In Situ, Real-Time Infrared (IR) Imaging for Metrology in Advanced Manufacturing

Syed A.M. Tofail, Aladin Mani, Joanna Bauer, Christophe Silien

Research output: Contribution to journalReview articlepeer-review

Abstract

This position paper provides a topical overview on the translation of infrared (IR)-based imaging techniques in metrological applications related to advance manufacturing with a particular focus on in situ imaging to obtain real-time process information. Fast imaging techniques using optical, X-ray, e-beam, ultrasound, or scanning probes are widely used in non-destructive testing (NDT), the translation of which to metrology requires detailed consideration of the technique in question as well as the instrumentation and adaption choices available. We review the use of IR imaging for metrology in advanced manufacturing based on the current use of IR thermography (IRT) and spectro-microscopy. We then discuss the opportunity of, and barriers against, the use IR techniques as potential metrological tools in advanced manufacturing and discuss technological directions that can be taken to enable rapid, real-time ambient measurements.

Original languageEnglish
Article number1800061
JournalAdvanced Engineering Materials
Volume20
Issue number6
DOIs
Publication statusPublished - Jun 2018

Keywords

  • in situ characterization
  • infrared
  • micro-spectroscopy
  • online metrology
  • real-time characterization
  • thermography

Fingerprint

Dive into the research topics of 'In Situ, Real-Time Infrared (IR) Imaging for Metrology in Advanced Manufacturing'. Together they form a unique fingerprint.

Cite this