TY - JOUR
T1 - In Situ, Real-Time Infrared (IR) Imaging for Metrology in Advanced Manufacturing
AU - Tofail, Syed A.M.
AU - Mani, Aladin
AU - Bauer, Joanna
AU - Silien, Christophe
N1 - Publisher Copyright:
© 2018 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
PY - 2018/6
Y1 - 2018/6
N2 - This position paper provides a topical overview on the translation of infrared (IR)-based imaging techniques in metrological applications related to advance manufacturing with a particular focus on in situ imaging to obtain real-time process information. Fast imaging techniques using optical, X-ray, e-beam, ultrasound, or scanning probes are widely used in non-destructive testing (NDT), the translation of which to metrology requires detailed consideration of the technique in question as well as the instrumentation and adaption choices available. We review the use of IR imaging for metrology in advanced manufacturing based on the current use of IR thermography (IRT) and spectro-microscopy. We then discuss the opportunity of, and barriers against, the use IR techniques as potential metrological tools in advanced manufacturing and discuss technological directions that can be taken to enable rapid, real-time ambient measurements.
AB - This position paper provides a topical overview on the translation of infrared (IR)-based imaging techniques in metrological applications related to advance manufacturing with a particular focus on in situ imaging to obtain real-time process information. Fast imaging techniques using optical, X-ray, e-beam, ultrasound, or scanning probes are widely used in non-destructive testing (NDT), the translation of which to metrology requires detailed consideration of the technique in question as well as the instrumentation and adaption choices available. We review the use of IR imaging for metrology in advanced manufacturing based on the current use of IR thermography (IRT) and spectro-microscopy. We then discuss the opportunity of, and barriers against, the use IR techniques as potential metrological tools in advanced manufacturing and discuss technological directions that can be taken to enable rapid, real-time ambient measurements.
KW - in situ characterization
KW - infrared
KW - micro-spectroscopy
KW - online metrology
KW - real-time characterization
KW - thermography
UR - http://www.scopus.com/inward/record.url?scp=85047736712&partnerID=8YFLogxK
U2 - 10.1002/adem.201800061
DO - 10.1002/adem.201800061
M3 - Review article
AN - SCOPUS:85047736712
SN - 1438-1656
VL - 20
JO - Advanced Engineering Materials
JF - Advanced Engineering Materials
IS - 6
M1 - 1800061
ER -