Indium segregation in InGaN quantum-well structures

N. Duxbury, U. Bangert, P. Dawson, E. J. Thrush, W. Van Der Stricht, K. Jacobs, I. Moerman

Research output: Contribution to journalArticlepeer-review

Abstract

Direct evidence for In-segregation in InGaN/GaN quantum-well structures is given via highly spatially resolved energy dispersive x-ray analysis performed in a dedicated scanning transmission electron microscope. The In fluctuations become increasingly pronounced in the vicinity of dislocations. The latter assist In diffusion and cause severe Ga/In intermixing.

Original languageEnglish
Pages (from-to)1600-1602
Number of pages3
JournalApplied Physics Letters
Volume76
Issue number12
DOIs
Publication statusPublished - 20 Mar 2000
Externally publishedYes

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