Abstract
Direct evidence for In-segregation in InGaN/GaN quantum-well structures is given via highly spatially resolved energy dispersive x-ray analysis performed in a dedicated scanning transmission electron microscope. The In fluctuations become increasingly pronounced in the vicinity of dislocations. The latter assist In diffusion and cause severe Ga/In intermixing.
Original language | English |
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Pages (from-to) | 1600-1602 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 76 |
Issue number | 12 |
DOIs | |
Publication status | Published - 20 Mar 2000 |
Externally published | Yes |