Integrating Advanced Deep Learning Features with SVM for Pathological Brain Detection: A Novel Hybrid Approach

Debendra Muduli, Santosh Kumar Sharma, Adyasha Rath, Ram Chandra Barik, Ganapati Panda

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The objective of this study is to create an automated method for detecting pathological conditions in the brain, which can aid radiologists in accurately identifying brain diseases more efficiently. By integrating magnetic resonance imaging (MRI) into the proposed system, it is anticipated that more precise information regarding brain soft tissues can be obtained. We propose a novel hybrid approach with non-handcrafted feature extraction techniques during study. During the feature extraction phase, we have employed two deep learning models called VGG-16 and Inception V3. The extracted feature vectors from each model have been concatenated and creates an ultimate feature vector for each image. The principal component analysis (PCA) has been utilised to reduce the feature set. Following this, we employed support vector machine with three kernels to categorize as pathological or healthy. For effectiveness of the suggested approach on confirmed using a publicly available dataset called DS-255 having 255 images. To ensure robust validation, a five-fold stratified cross-validation process has implemented. From experimental analysis, we observed our deployed scheme achieved better performance result i.e., 98% based on AUC value 1.00. The simulation outcomes unequivocally represents, employed scheme outperforms superior than other traditional algorithms in form of detection outcomes, even when working based on limited number of features.

Original languageEnglish
Title of host publication2023 IEEE 3rd International Conference on Applied Electromagnetics, Signal Processing, and Communication, AESPC 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350358742
DOIs
Publication statusPublished - 2023
Externally publishedYes
Event3rd IEEE International Conference on Applied Electromagnetics, Signal Processing, and Communication, AESPC 2023 - Bhubaneswar, India
Duration: 24 Nov 202326 Nov 2023

Publication series

Name2023 IEEE 3rd International Conference on Applied Electromagnetics, Signal Processing, and Communication, AESPC 2023

Conference

Conference3rd IEEE International Conference on Applied Electromagnetics, Signal Processing, and Communication, AESPC 2023
Country/TerritoryIndia
CityBhubaneswar
Period24/11/2326/11/23

Keywords

  • CLAHE
  • Convolutional Neural Networks
  • Inception V3
  • Principal Component Analysis
  • SVM
  • Transfer Learning
  • VGG16

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