Investigations of chemical and electronic inhomogeneities in BaPb 1-xBixO3 via highly spatially resolved electron energy loss spectroscopy

A. Gutiérrez-Sosa, U. Bangert, W. R. Flavell

Research output: Contribution to journalArticlepeer-review

Abstract

BaPb1-xBixO3 crystals were studied for chemical and electronic inhomogeneities. Scanning transmission electron microscope (STEM) which is equipped with energy dispersive X-ray and electron energy loss spectroscopy (EELS) was used. STEM studied the nm-size crystals structurally and analytically. The results show high inhomogeneity in the single crystals of any composition.

Original languageEnglish
Pages (from-to)6639-6643
Number of pages5
JournalJournal of Applied Physics
Volume94
Issue number10
DOIs
Publication statusPublished - 15 Nov 2003

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