Investigations of chemical and electronic inhomogeneities in BaPb 1-xBixO3 via highly spatially resolved electron energy loss spectroscopy

A. Gutiérrez-Sosa; U. Bangert; W. R. Flavell

doi:10.1063/1.1620374

Investigations of chemical and electronic inhomogeneities in BaPb _1-xBi_xO₃ via highly spatially resolved electron energy loss spectroscopy

A. Gutiérrez-Sosa
, U. Bangert
, W. R. Flavell

University of Manchester

Research output: Contribution to journal › Article › peer-review

Abstract

BaPb_1-xBi_xO₃ crystals were studied for chemical and electronic inhomogeneities. Scanning transmission electron microscope (STEM) which is equipped with energy dispersive X-ray and electron energy loss spectroscopy (EELS) was used. STEM studied the nm-size crystals structurally and analytically. The results show high inhomogeneity in the single crystals of any composition.

Original language	English
Pages (from-to)	6639-6643
Number of pages	5
Journal	Journal of Applied Physics
Volume	94
Issue number	10
DOIs	https://doi.org/10.1063/1.1620374
Publication status	Published - 15 Nov 2003
Externally published	Yes

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10.1063/1.1620374

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title = "Investigations of chemical and electronic inhomogeneities in BaPb 1-xBixO3 via highly spatially resolved electron energy loss spectroscopy",

abstract = "BaPb1-xBixO3 crystals were studied for chemical and electronic inhomogeneities. Scanning transmission electron microscope (STEM) which is equipped with energy dispersive X-ray and electron energy loss spectroscopy (EELS) was used. STEM studied the nm-size crystals structurally and analytically. The results show high inhomogeneity in the single crystals of any composition.",

author = "A. Guti{\'e}rrez-Sosa and U. Bangert and Flavell, \{W. R.\}",

year = "2003",

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doi = "10.1063/1.1620374",

language = "English",

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journal = "Journal of Applied Physics",

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T1 - Investigations of chemical and electronic inhomogeneities in BaPb 1-xBixO3 via highly spatially resolved electron energy loss spectroscopy

AU - Gutiérrez-Sosa, A.

AU - Bangert, U.

AU - Flavell, W. R.

PY - 2003/11/15

Y1 - 2003/11/15

N2 - BaPb1-xBixO3 crystals were studied for chemical and electronic inhomogeneities. Scanning transmission electron microscope (STEM) which is equipped with energy dispersive X-ray and electron energy loss spectroscopy (EELS) was used. STEM studied the nm-size crystals structurally and analytically. The results show high inhomogeneity in the single crystals of any composition.

AB - BaPb1-xBixO3 crystals were studied for chemical and electronic inhomogeneities. Scanning transmission electron microscope (STEM) which is equipped with energy dispersive X-ray and electron energy loss spectroscopy (EELS) was used. STEM studied the nm-size crystals structurally and analytically. The results show high inhomogeneity in the single crystals of any composition.

UR - https://www.scopus.com/pages/publications/0344946232

U2 - 10.1063/1.1620374

DO - 10.1063/1.1620374

M3 - Article

AN - SCOPUS:0344946232

SN - 0021-8979

VL - 94

SP - 6639

EP - 6643

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 10

ER -

Investigations of chemical and electronic inhomogeneities in BaPb _1-xBi_xO₃ via highly spatially resolved electron energy loss spectroscopy

Abstract

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