IS and T International Symposium on Electronic Imaging Science and Technology

Pepijn Van De Ven

Department of Electronics & Computer Engineering

Research output: Contribution to conference › Paper

Original language	English (Ireland)
DOIs	https://doi.org/10.2352/EI.2022.34.16.AVM-147
Publication status	Published - 2022

Access to Document

10.2352/EI.2022.34.16.AVM-147

Cite this