Localizing multiple faults in Simulink models

Bing Liu, Lucia, Shiva Nejati, Lionel Briand, Thomas Bruckmann

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

As Simulink is a widely used language in the embedded industry, there is a growing need to support debugging activities for Simulink models. In this work, we propose an approach to localize multiple faults in Simulink models. Our approach builds on statistical debugging and is iterative. At each iteration, we identify and resolve one fault and re-test models to focus on localizing faults that might have been masked before. We use decision trees to cluster together failures that satisfy similar (logical) conditions on model blocks or inputs. We then present two alternative selection criteria to choose a cluster that is more likely to yield the best fault localization results among the clusters produced by our decision trees. Engineers are expected to inspect the ranked list obtained from the selected cluster to identify faults. We evaluate our approach on 240 multi-fault models obtained from three different industrial subjects. We compare our approach with two baselines: (1) Statistical debugging without clustering, and (2) State-of-the-art clustering-based statistical debugging. Our results show that our approach significantly reduces the number of blocks that engineers need to inspect in order to localize all faults, when compared with the two baselines. Furthermore, with our approach, there is less performance degradation than in the baselines when increasing the number of faults in the underlying models.

Original languageEnglish
Title of host publication2016 IEEE 23rd International Conference on Software Analysis, Evolution, and Reengineering, SANER 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages146-156
Number of pages11
ISBN (Electronic)9781509018550
DOIs
Publication statusPublished - 20 May 2016
Externally publishedYes
Event23rd IEEE International Conference on Software Analysis, Evolution, and Reengineering, SANER 2016 - Suita, Osaka, Japan
Duration: 14 Mar 201618 Mar 2016

Publication series

Name2016 IEEE 23rd International Conference on Software Analysis, Evolution, and Reengineering, SANER 2016
Volume1

Conference

Conference23rd IEEE International Conference on Software Analysis, Evolution, and Reengineering, SANER 2016
Country/TerritoryJapan
CitySuita, Osaka
Period14/03/1618/03/16

Keywords

  • Decision trees
  • Fault localization
  • Machine learning
  • Simulink models
  • Statistical debugging

Fingerprint

Dive into the research topics of 'Localizing multiple faults in Simulink models'. Together they form a unique fingerprint.

Cite this