Mapping electron-beam-injected trapped charge with scattering scanning near-field optical microscopy

Physics

• Nanoscale 100%
• Dielectric Material 100%
• Electron Beam 100%
• Optoelectronics 50%
• Electrostatics 50%
• Semiconductor Device 50%
• Property of Materials 50%
• Electric Charge 50%

Engineering

• Optical Field 100%
• Nanoscale 66%
• Optoelectronics 33%
• Biomedical Application 33%
• Dielectrics 33%
• Electric Charge 33%
• Experimental Report 33%
• Dielectric Sample 33%
• Semiconductor Device Fabrication 33%
• Image Content 33%
• Dipole Interaction 33%

Material Science

• Surface (Surface Science) 100%
• Dielectric Material 100%
• Semiconductor Device Fabrication 50%