Mapping electron-beam-injected trapped charge with scattering scanning near-field optical microscopy

  • Denis E. Tranca
  • , Emilio Sánchez-Ortiga
  • , Genaro Saavedra
  • , Manuel Martínez-Corral
  • , Syed A.M. Tofail
  • , Stefan G. Stanciu
  • , Radu Hristu
  • , George A. Stanciu

Research output: Contribution to journal › Article › peer-review

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