Mapping electron-beam-injected trapped charge with scattering scanning near-field optical microscopy
- Denis E. Tranca
- , Emilio Sánchez-Ortiga
- , Genaro Saavedra
- , Manuel Martínez-Corral
- , Syed A.M. Tofail
- , Stefan G. Stanciu
- , Radu Hristu
- , George A. Stanciu
- University Politehnica of Bucharest
- University of Valencia
Research output: Contribution to journal › Article › peer-review