Measurement of the Adsorption of Cytochrome c onto the External Surface of a Thin-Film Mesoporous Silicate by Ellipsometry

J. Deere; M. Serantoni; K. J. Edler; B. K. Hodnett; J. G. Wall; E. Magner

doi:10.1021/la035358y

Measurement of the Adsorption of Cytochrome c onto the External Surface of a Thin-Film Mesoporous Silicate by Ellipsometry

J. Deere, M. Serantoni, K. J. Edler, B. K. Hodnett, J. G. Wall, E. Magner

Research output: Contribution to journal › Article › peer-review

Abstract

The measurement of adsorption of cytochromes c onto the external surfaces of a thin film mesoporous silicates (MPS) supported by silicon wafers was discussed. Adsorption in a multilayered system consisting silicon, SiO ₂, MPS, and adsorbed proteins was analyzed using ellipsometry. Synthesis of MPS thin films on 0.5 mm thick silicon wafers was done using a dip-coating alcohol vaporization method. It was found that the thickness of silicon substrate was uniform and was not changed with film processing.

Original language	English
Pages (from-to)	532-536
Number of pages	5
Journal	Langmuir
Volume	20
Issue number	2
DOIs	https://doi.org/10.1021/la035358y
Publication status	Published - 20 Jan 2004

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10.1021/la035358y

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abstract = "The measurement of adsorption of cytochromes c onto the external surfaces of a thin film mesoporous silicates (MPS) supported by silicon wafers was discussed. Adsorption in a multilayered system consisting silicon, SiO 2, MPS, and adsorbed proteins was analyzed using ellipsometry. Synthesis of MPS thin films on 0.5 mm thick silicon wafers was done using a dip-coating alcohol vaporization method. It was found that the thickness of silicon substrate was uniform and was not changed with film processing.",

author = "J. Deere and M. Serantoni and Edler, {K. J.} and Hodnett, {B. K.} and Wall, {J. G.} and E. Magner",

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AU - Hodnett, B. K.

AU - Wall, J. G.

AU - Magner, E.

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Y1 - 2004/1/20

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AB - The measurement of adsorption of cytochromes c onto the external surfaces of a thin film mesoporous silicates (MPS) supported by silicon wafers was discussed. Adsorption in a multilayered system consisting silicon, SiO 2, MPS, and adsorbed proteins was analyzed using ellipsometry. Synthesis of MPS thin films on 0.5 mm thick silicon wafers was done using a dip-coating alcohol vaporization method. It was found that the thickness of silicon substrate was uniform and was not changed with film processing.

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ER -

Measurement of the Adsorption of Cytochrome c onto the External Surface of a Thin-Film Mesoporous Silicate by Ellipsometry

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