Metals on BN studied by high resolution transmission electron microscopy

U. Bangert, R. Zan, Q. Ramasse, Rashid Jalil, Ibstam Riaz, K. S. Novoselov

Research output: Contribution to journalConference articlepeer-review

Abstract

Metal impurities, gold and nickel, have been deliberately introduced into boron-nitride (BN) sheets. The structural and topographic properties of doped BN have been studied by aberration corrected scanning transmission electron microscopy (STEM). Analysis revealed that metal atoms cluster preferentially in/on contaminated areas. The metal coverage on BN is almost the same for the same evaporated amount of 1 Å.

Original languageEnglish
Article number012050
JournalJournal of Physics: Conference Series
Volume371
DOIs
Publication statusPublished - 2012
Externally publishedYes
EventElectron Microscopy and Analysis Group Conference 2011, EMAG 2011 - Birmingham, United Kingdom
Duration: 6 Sep 20119 Sep 2011

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